Theory of transparent BIST for RAMs
I present the theoretical aspects of a technique called transparent BIST for RAMs. This technique applies to any RAM test algorithm and transforms it into a transparent one. The interest of the transparent test algorithms is that testing preserves the contents of the RAM. The transparent test algori...
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| Published in | IEEE transactions on computers Vol. 45; no. 10; pp. 1141 - 1156 |
|---|---|
| Main Author | |
| Format | Journal Article |
| Language | English |
| Published |
New York, NY
IEEE
01.10.1996
Institute of Electrical and Electronics Engineers |
| Subjects | |
| Online Access | Get full text |
| ISSN | 0018-9340 |
| DOI | 10.1109/12.543708 |
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| Abstract | I present the theoretical aspects of a technique called transparent BIST for RAMs. This technique applies to any RAM test algorithm and transforms it into a transparent one. The interest of the transparent test algorithms is that testing preserves the contents of the RAM. The transparent test algorithm is then used to implement a transparent BIST. This kind of BIST is very suitable for periodic testing of RAMs. The theoretical analysis shows that this transparent BIST technique does not decrease the fault coverage for modeled faults, it behaves better for unmodeled ones and does not increase the aliasing with respect to the initial test algorithm. Furthermore, transparent BIST involves only slightly higher area overhead with respect to standard BIST. Thus, transparent BIST becomes more attractive than standard BIST since it can be used for both fabrication testing and periodic testing. |
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| AbstractList | In this paper I present the theoretical aspects of a technique called transparent BIST for RAMs. This technique applies to any RAM test algorithm and transforms it into a transparent one. The interest of the transparent test algorithms is that testing preserves the contents of the RAM. The transparent test algorithm is then used to implement a transparent BIST. This kind of BIST is very suitable for periodic testing of RAMs. The theoretical analysis presented here shows that this transparent BIST technique does not decrease the fault coverage for modeled faults, it behaves better for unmodeled ones and does not increase the aliasing with respect to the initial test algorithm. Furthermore, transparent BIST involves only slightly higher area overhead with respect to standard BIST. Thus, transparent BIST becomes more attractive than standard BIST since it can be used for both fabrication testing and periodic testing. I present the theoretical aspects of a technique called transparent BIST for RAMs. This technique applies to any RAM test algorithm and transforms it into a transparent one. The interest of the transparent test algorithms is that testing preserves the contents of the RAM. The transparent test algorithm is then used to implement a transparent BIST. This kind of BIST is very suitable for periodic testing of RAMs. The theoretical analysis shows that this transparent BIST technique does not decrease the fault coverage for modeled faults, it behaves better for unmodeled ones and does not increase the aliasing with respect to the initial test algorithm. Furthermore, transparent BIST involves only slightly higher area overhead with respect to standard BIST. Thus, transparent BIST becomes more attractive than standard BIST since it can be used for both fabrication testing and periodic testing. I present the theoretical aspects of a technique called transparent BIST for RAMs. This technique applies to any RAM test algorithm and transforms it into a transparent one. The interest of the transparent test algorithms is that testing preserves the contents of the RAM. The transparent test algorithm is then used to implement a transparent BIST. This kind of BIST is very suitable for periodic testing of RAMs. The theoretical analysis shows that this transparent BIST technique does not decrease the fault coverage for modeled faults, it behaves better for unmodeled ones and does not increase the aliasing with respect to the initial test algorithm. Furthermore, transparent BIST involves only slightly higher area overhead with respect to standard BIST. Thus, transparent BIST becomes more attractive than standard BIST since it can be used for both fabrication testing and periodic testing |
| Author | Nicolaidis, M. |
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| Cites_doi | 10.1109/TC.1980.1675610 10.1109/TC.1985.1676547 10.1109/TC.1980.1675556 10.1109/ICCD.1992.276223 10.1109/92.365454 10.1109/43.62779 10.1109/TC.1978.1675150 10.1109/TC.1981.1675739 10.1109/TC.1985.1676572 10.1109/ETC.1993.246573 10.1109/TEST.1992.527880 10.1145/78949.78950 10.1109/TC.1980.1675601 10.1109/ICCAD.1991.185244 |
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| Keywords | Direct access Storage management Algorithm complexity Random access storage Signature analysis Failures Modeling Addressing transparent-test-algorithms fault-coverage RAM-test-algorithm modeled-faults fabrication-testing periodic-testing aliasing transparent-BIST |
| Language | English |
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| References | bibt114118 bibt114117 williams (bibt114116) 1987 nicolaidis (bibt114119) 1985 bibt114114 bibt114113 bibt114115 bibt114110 marinescu (bibt11415) 1982 bibt114112 bibt114111 bibt11416 bibt11417 bibt11418 bibt11419 bibt11412 bibt11413 bibt11414 bibt11411 koeneman (bibt114120) 1986 |
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| Snippet | I present the theoretical aspects of a technique called transparent BIST for RAMs. This technique applies to any RAM test algorithm and transforms it into a... In this paper I present the theoretical aspects of a technique called transparent BIST for RAMs. This technique applies to any RAM test algorithm and... |
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| SubjectTerms | Algorithm design and analysis Algorithmics. Computability. Computer arithmetics Applied sciences Built-in self-test Circuit faults Circuit testing Compaction Computer science; control theory; systems Electronics Engineering Sciences Exact sciences and technology Fault detection Handwriting recognition Integrated circuits Integrated circuits by function (including memories and processors) Manufacturing Memory and file management (including protection and security) Memory organisation. Data processing Micro and nanotechnologies Microelectronics Performance evaluation Read-write memory Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Software Theoretical computing |
| Title | Theory of transparent BIST for RAMs |
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