Stochastic Time-Domain Mapping for Comprehensive Uncertainty Assessment in Eye Diagrams - Telescu, Mihai; Trinchero, Riccardo; Soleimani, Nastaran; Tanguy, Noel; Stievano, Igor Simone (IEEE transactions on electromagnetic compatibility, 2023)
Keywords: Algorithms; Apertures; Engineering Sciences; Eye diagram; high-speed interconnects; Kernel; Kernel functions; kernel machine regressions; Machine learning; Micro and nanotechnologies; Microelectronics; Quality assessment; Regression; Shape; signal integrity; Smart materials; smart textiles; Stochastic processes; Support vector machines; Textiles; Tolerances; Training; Uncertainty; uncertainty quantification; wearable electronics; uncertainty quantification (UQ); signal integrity; kernel-machine regressions; smart textiles; eye diagram; high-speed interconnects; wearable electronics