DC conduction properties of oxidised erbium films deposited on Si(1 0 0) substrates - Dakhel, A.A. (Journal of alloys and compounds, 2005)
Keywords: Condensed matter: electronic structure, electrical, magnetic, and optical properties; Dielectric breakdown and space-charge effects; Dielectric phenomena; Dielectric properties of solids and liquids; Dielectrics, piezoelectrics, and ferroelectrics and their properties; Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures; Electronic transport in interface structures; Erbium oxide; Exact sciences and technology; Insulating films; Metal-insulator-semiconductor structures (including semiconductor-to-insulator); Physics; SCLC mechanism; 77.55.+f; Insulating films; Erbium oxide; Dielectric phenomena; 72.20.−I; SCLC mechanism; Voltage dependence; Annealing; Electrical conductivity; Phase transformations; 72.20.-I Insulating films; MOS structure; Electron charge distribution; t-J model; XRD; Thin films; Charge density; Traps; Silicon oxides; Capacitance; Oxidation; IV characteristic; Erbium