Pehl, R. H., Madden, N. W., Elliott, J. H., Raudorf, T. W., Trammell, R. C., & Darken, L. S. (1979). Radiation Damage Resistance of Reverse Electrode GE Coaxial Detectors. IEEE transactions on nuclear science, 26(1), 321-323. https://doi.org/10.1109/TNS.1979.4329652
Chicago Style (17th ed.) CitationPehl, Richard H., Norman W. Madden, Jack H. Elliott, Thomas W. Raudorf, Rex C. Trammell, and Lawrence S. Darken. "Radiation Damage Resistance of Reverse Electrode GE Coaxial Detectors." IEEE Transactions on Nuclear Science 26, no. 1 (1979): 321-323. https://doi.org/10.1109/TNS.1979.4329652.
MLA (9th ed.) CitationPehl, Richard H., et al. "Radiation Damage Resistance of Reverse Electrode GE Coaxial Detectors." IEEE Transactions on Nuclear Science, vol. 26, no. 1, 1979, pp. 321-323, https://doi.org/10.1109/TNS.1979.4329652.