章龙江, 王. 陈. 何. 邱. (2008). A Signed Digraphs Based Method for Detecting Inherently Unsafe Factors of Chemical Process at Conceptual Design Stage. Chinese journal of chemical engineering, 16(1), 52-56. https://doi.org/10.1016/S1004-9541(08)60036-1
Chicago Style (17th ed.) Citation章龙江, 王杭州 陈丙珍 何小荣 邱彤. "A Signed Digraphs Based Method for Detecting Inherently Unsafe Factors of Chemical Process at Conceptual Design Stage." Chinese Journal of Chemical Engineering 16, no. 1 (2008): 52-56. https://doi.org/10.1016/S1004-9541(08)60036-1.
MLA (9th ed.) Citation章龙江, 王杭州 陈丙珍 何小荣 邱彤. "A Signed Digraphs Based Method for Detecting Inherently Unsafe Factors of Chemical Process at Conceptual Design Stage." Chinese Journal of Chemical Engineering, vol. 16, no. 1, 2008, pp. 52-56, https://doi.org/10.1016/S1004-9541(08)60036-1.