Growth instability and surface phase transition of Ti thin film on Si(1 1 1): An atomic force microscopy study - Aurongzeb, Deeder (Applied surface science, 2006)
Keywords: Annealing; Atomic force microscopy; Condensed matter: structure, mechanical and thermal properties; Exact sciences and technology; Phase transitions and critical phenomena; Physics; Scaling properties; Solid surfaces and solid-solid interfaces; Structure and morphology; thickness; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties); Thin film structure and morphology; Scaling properties; Atomic force microscopy; Annealing; Grain size; Phase transformations; Roughness; Spectral analysis; Surface structure; Thin films; Transition elements; Scaling laws; Titanium; Instability; Spectral density