Aurongzeb, D. (2006). Growth instability and surface phase transition of Ti thin film on Si(1 1 1): An atomic force microscopy study. Applied surface science, 252(18), 6135-6140. https://doi.org/10.1016/j.apsusc.2005.07.026
Chicago Style (17th ed.) CitationAurongzeb, Deeder. "Growth Instability and Surface Phase Transition of Ti Thin Film on Si(1 1 1): An Atomic Force Microscopy Study." Applied Surface Science 252, no. 18 (2006): 6135-6140. https://doi.org/10.1016/j.apsusc.2005.07.026.
MLA (9th ed.) CitationAurongzeb, Deeder. "Growth Instability and Surface Phase Transition of Ti Thin Film on Si(1 1 1): An Atomic Force Microscopy Study." Applied Surface Science, vol. 252, no. 18, 2006, pp. 6135-6140, https://doi.org/10.1016/j.apsusc.2005.07.026.
Warning: These citations may not always be 100% accurate.