APA (7th ed.) Citation

He, K., Lai, K. K., & Yen, J. (2012). Ensemble forecasting of Value at Risk via Multi Resolution Analysis based methodology in metals markets. Expert systems with applications, 39(4), 4258-4267. https://doi.org/10.1016/j.eswa.2011.09.108

Chicago Style (17th ed.) Citation

He, Kaijian, Kin Keung Lai, and Jerome Yen. "Ensemble Forecasting of Value at Risk via Multi Resolution Analysis Based Methodology in Metals Markets." Expert Systems with Applications 39, no. 4 (2012): 4258-4267. https://doi.org/10.1016/j.eswa.2011.09.108.

MLA (9th ed.) Citation

He, Kaijian, et al. "Ensemble Forecasting of Value at Risk via Multi Resolution Analysis Based Methodology in Metals Markets." Expert Systems with Applications, vol. 39, no. 4, 2012, pp. 4258-4267, https://doi.org/10.1016/j.eswa.2011.09.108.