APA (7th ed.) Citation

Kumar, V., Maan, A. S., & Akhtar, J. (2014). Barrier height inhomogeneities induced anomaly in thermal sensitivity of Ni/4H-SiC Schottky diode temperature sensor. Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 32(4), . https://doi.org/10.1116/1.4884756

Chicago Style (17th ed.) Citation

Kumar, Vibhor, Anup Singh Maan, and Jamil Akhtar. "Barrier Height Inhomogeneities Induced Anomaly in Thermal Sensitivity of Ni/4H-SiC Schottky Diode Temperature Sensor." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 32, no. 4 (2014). https://doi.org/10.1116/1.4884756.

MLA (9th ed.) Citation

Kumar, Vibhor, et al. "Barrier Height Inhomogeneities Induced Anomaly in Thermal Sensitivity of Ni/4H-SiC Schottky Diode Temperature Sensor." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, vol. 32, no. 4, 2014, https://doi.org/10.1116/1.4884756.