APA (7th ed.) Citation

Preiß, E. I., Merle, B., Xiao, Y., Gannott, F., Liebig, J. P., Wheeler, J. M., & Göken, M. (2021). Applicability of focused Ion beam (FIB) milling with gallium, neon, and xenon to the fracture toughness characterization of gold thin films. Journal of materials research, 36(12), 2505-2514. https://doi.org/10.1557/s43578-020-00045-w

Chicago Style (17th ed.) Citation

Preiß, Eva I., Benoit Merle, Yuan Xiao, Florentina Gannott, Jan P. Liebig, Jeffrey M. Wheeler, and Mathias Göken. "Applicability of Focused Ion Beam (FIB) Milling with Gallium, Neon, and Xenon to the Fracture Toughness Characterization of Gold Thin Films." Journal of Materials Research 36, no. 12 (2021): 2505-2514. https://doi.org/10.1557/s43578-020-00045-w.

MLA (9th ed.) Citation

Preiß, Eva I., et al. "Applicability of Focused Ion Beam (FIB) Milling with Gallium, Neon, and Xenon to the Fracture Toughness Characterization of Gold Thin Films." Journal of Materials Research, vol. 36, no. 12, 2021, pp. 2505-2514, https://doi.org/10.1557/s43578-020-00045-w.