Accuracy of industrial computed tomography measurements: Experimental results from an international comparison
X-ray computed tomography (CT) is increasingly used in industry for dimensional quality control purposes. However, due to numerous and complex error sources and to the current lack of standardization, industrial users are facing difficulties in the evaluation of CT measurements uncertainty and metro...
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| Published in | CIRP annals Vol. 61; no. 1; pp. 491 - 494 |
|---|---|
| Main Author | |
| Format | Journal Article Conference Proceeding |
| Language | English |
| Published |
Kidlington
Elsevier Ltd
2012
Elsevier |
| Subjects | |
| Online Access | Get full text |
| ISSN | 0007-8506 |
| DOI | 10.1016/j.cirp.2012.03.021 |
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| Abstract | X-ray computed tomography (CT) is increasingly used in industry for dimensional quality control purposes. However, due to numerous and complex error sources and to the current lack of standardization, industrial users are facing difficulties in the evaluation of CT measurements uncertainty and metrological performance of CT systems. This paper analyses the state of the art in industrial CT metrology, with focus on accuracy and traceability issues, by examining specific results obtained from the first international intercomparison of CT systems for dimensional metrology. The intercomparison involved 15 CT systems operated by expert users in Europe, America and Asia. |
|---|---|
| AbstractList | X-ray computed tomography (CT) is increasingly used in industry for dimensional quality control purposes. However, due to numerous and complex error sources and to the current lack of standardization, industrial users are facing difficulties in the evaluation of CT measurements uncertainty and metrological performance of CT systems. This paper analyses the state of the art in industrial CT metrology, with focus on accuracy and traceability issues, by examining specific results obtained from the first international intercomparison of CT systems for dimensional metrology. The intercomparison involved 15 CT systems operated by expert users in Europe, America and Asia. |
| Author | Carmignato, Simone |
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| References | Carmignato (bib0080) 2011; 2 Carmignato, Savio (bib0025) 2011; 60 ISO/IEC 17043:2010, Conformity assessment—general requirements for proficiency testing. ISO, Geneva, 2010. De Chiffre (bib0060) 2005; 54 Neuschaefer-Rube (bib0070) 2008; 19 Carmignato (bib0030) 2009; 20 Carmignato (bib0075) 2011 Krämer, Weckenmann (bib0020) 2010; 21 Kruth (bib0005) 2011; 60 Bartscher (bib0010) 2007; 56 VDI/VDE 2617 (2009) Part 13 draft, Guideline for the application of DIN EN ISO 10360 for CMMs with CT-sensors. VDI, Duesseldorf. Carmignato S, et al., First international interlaboratory comparison on computed tomography for dimensional metrology, submitted to Precision Engineering, in press. Schmitt, Niggemann (bib0015) 2010; 21 Carmignato (bib0055) 2010; 59 ISO/WD 10360-11 (2011) GPS—acceptance and reverification tests for CMMs - Part 11: Computed tomography. ISO, Geneva. Weckenmann (bib0045) 2009; 58 Carmignato (10.1016/j.cirp.2012.03.021_bib0030) 2009; 20 Bartscher (10.1016/j.cirp.2012.03.021_bib0010) 2007; 56 10.1016/j.cirp.2012.03.021_bib0050 10.1016/j.cirp.2012.03.021_bib0040 Neuschaefer-Rube (10.1016/j.cirp.2012.03.021_bib0070) 2008; 19 Schmitt (10.1016/j.cirp.2012.03.021_bib0015) 2010; 21 10.1016/j.cirp.2012.03.021_bib0065 Carmignato (10.1016/j.cirp.2012.03.021_bib0055) 2010; 59 10.1016/j.cirp.2012.03.021_bib0035 Carmignato (10.1016/j.cirp.2012.03.021_bib0025) 2011; 60 De Chiffre (10.1016/j.cirp.2012.03.021_bib0060) 2005; 54 Kruth (10.1016/j.cirp.2012.03.021_bib0005) 2011; 60 Weckenmann (10.1016/j.cirp.2012.03.021_bib0045) 2009; 58 Krämer (10.1016/j.cirp.2012.03.021_bib0020) 2010; 21 Carmignato (10.1016/j.cirp.2012.03.021_bib0075) 2011 Carmignato (10.1016/j.cirp.2012.03.021_bib0080) 2011; 2 |
| References_xml | – reference: VDI/VDE 2617 (2009) Part 13 draft, Guideline for the application of DIN EN ISO 10360 for CMMs with CT-sensors. 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| SubjectTerms | Accuracy Applied sciences Computation Computed tomography Error analysis Exact sciences and technology Industrial metrology. Testing Measurement Mechanical engineering. Machine design Metrology State of the art Tomography Uncertainty X-rays |
| Title | Accuracy of industrial computed tomography measurements: Experimental results from an international comparison |
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