APA (7th ed.) Citation

Kareem, A. B., & Hur, J. (2022). Towards Data-Driven Fault Diagnostics Framework for SMPS-AEC Using Supervised Learning Algorithms. Electronics (Basel), 11(16), 2492. https://doi.org/10.3390/electronics11162492

Chicago Style (17th ed.) Citation

Kareem, Akeem Bayo, and Jang-Wook Hur. "Towards Data-Driven Fault Diagnostics Framework for SMPS-AEC Using Supervised Learning Algorithms." Electronics (Basel) 11, no. 16 (2022): 2492. https://doi.org/10.3390/electronics11162492.

MLA (9th ed.) Citation

Kareem, Akeem Bayo, and Jang-Wook Hur. "Towards Data-Driven Fault Diagnostics Framework for SMPS-AEC Using Supervised Learning Algorithms." Electronics (Basel), vol. 11, no. 16, 2022, p. 2492, https://doi.org/10.3390/electronics11162492.