Influence of Microscopic Electric Field Enhancement on Microparticle Impact Phenomena Based on Fractal Modeling

The objective of this paper is to study the influence of microscopic electric field enhancement caused by microprotrusions on microparticle impact phenomena based on fractal modeling. In this paper, microprotrusions with a radius of 5 μm and heights 0, 1, 2, 5, and 10 μm are considered, according to...

Full description

Saved in:
Bibliographic Details
Published inIEEE transactions on plasma science Vol. 45; no. 9; pp. 2588 - 2595
Main Authors Zhang, Yingyao, Xu, Xinye, Jin, Lijun, An, Zhenlian, Geng, Yingsan, Wang, Jianhua
Format Journal Article
LanguageEnglish
Published New York IEEE 01.09.2017
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects
Online AccessGet full text
ISSN0093-3813
1939-9375
DOI10.1109/TPS.2017.2727542

Cover

Abstract The objective of this paper is to study the influence of microscopic electric field enhancement caused by microprotrusions on microparticle impact phenomena based on fractal modeling. In this paper, microprotrusions with a radius of 5 μm and heights 0, 1, 2, 5, and 10 μm are considered, according to the height-width ratios 0, 0.2, 0.4, 1, and 2, respectively. The microparticles and contacts are assumed to be made of copper. The radius of the microparticle is assumed to be 0.1 μm and the applied voltage is 60 kV. First, microprotrusions with different height-width ratios are modeled based on fractal theory. Then, the microscopic electric field distortions caused by microprotrusions on the contact surface are simulated based on fractal models of microprotrusions. The impact velocities of microparticles under different cases are calculated based on basic microparticle theories. Finally, the microparticle impact phenomena are simulated using the smoothed particle hydrodynamics method under the microscopic electric field caused by microprotrusions on the contact surface. The results show that the microscopic electric field enhancement caused by microprotrusions will have a significant influence on impact velocities, the characteristics of secondary particles, and the craters produced on the target contact surface. The results of this paper may provide some useful information to further understand the vacuum breakdown initiated by microparticles.
AbstractList The objective of this paper is to study the influence of microscopic electric field enhancement caused by microprotrusions on microparticle impact phenomena based on fractal modeling. In this paper, microprotrusions with a radius of 5 μm and heights 0, 1, 2, 5, and 10 μm are considered, according to the height-width ratios 0, 0.2, 0.4, 1, and 2, respectively. The microparticles and contacts are assumed to be made of copper. The radius of the microparticle is assumed to be 0.1 μm and the applied voltage is 60 kV. First, microprotrusions with different height-width ratios are modeled based on fractal theory. Then, the microscopic electric field distortions caused by microprotrusions on the contact surface are simulated based on fractal models of microprotrusions. The impact velocities of microparticles under different cases are calculated based on basic microparticle theories. Finally, the microparticle impact phenomena are simulated using the smoothed particle hydrodynamics method under the microscopic electric field caused by microprotrusions on the contact surface. The results show that the microscopic electric field enhancement caused by microprotrusions will have a significant influence on impact velocities, the characteristics of secondary particles, and the craters produced on the target contact surface. The results of this paper may provide some useful information to further understand the vacuum breakdown initiated by microparticles.
Author Lijun Jin
Zhenlian An
Yingyao Zhang
Jianhua Wang
Yingsan Geng
Xinye Xu
Author_xml – sequence: 1
  givenname: Yingyao
  orcidid: 0000-0001-5831-5097
  surname: Zhang
  fullname: Zhang, Yingyao
– sequence: 2
  givenname: Xinye
  surname: Xu
  fullname: Xu, Xinye
– sequence: 3
  givenname: Lijun
  surname: Jin
  fullname: Jin, Lijun
– sequence: 4
  givenname: Zhenlian
  surname: An
  fullname: An, Zhenlian
– sequence: 5
  givenname: Yingsan
  surname: Geng
  fullname: Geng, Yingsan
– sequence: 6
  givenname: Jianhua
  surname: Wang
  fullname: Wang, Jianhua
BookMark eNp9kEtPAjEURhuDiaDuTdw0cT14286rSyWgJBBJxPWkdO5IydCOnbLw31sCceHCVW_S893HGZGBdRYJuWMwZgzk43r1PubAijEveJGl_IIMmRQykaLIBmQIIEUiSiauyKjvdwAszYAPiZvbpj2g1UhdQ5dGe9dr1xlNpy3q4GMxM9jWdGq3KlJ7tIE6eyI75YPRLdL5vlM60NUWrYuEos-qx_rIzXz8UC1duhpbYz9vyGWj2h5vz-81-ZhN15PXZPH2Mp88LRItchYSAUXZ8IZlwGSuASVnRQEN8iJVqGuNaak39SbNG1QCNrjRWaYhkjmXMs9rcU0eTn07774O2Idq5w7expFV1JJzUfKURSo_Uceze49NpU1QwTgbvDJtxaA6yq2i3OootzrLjUH4E-y82Sv__V_k_hQxiPiLlwBlGTf6AVHhh5o
CODEN ITPSBD
CitedBy_id crossref_primary_10_1109_TDEI_2022_3163787
crossref_primary_10_1109_TDEI_2019_007659
crossref_primary_10_1109_TDEI_2021_009494
crossref_primary_10_1109_TDEI_2020_009271
Cites_doi 10.1126/science.156.3775.636
10.1016/S0045-7930(01)00105-0
10.1109/27.964467
10.1109/TDEI.2016.006028
10.1063/1.1703148
10.1109/TDEI.2011.6118653
10.1109/DEIV.2006.357224
10.1080/10402000903502261
10.1109/TDEI.2017.006364
10.1109/TDEI.2009.5361595
10.1109/DEIV.1996.545312
10.1063/1.1702243
ContentType Journal Article
Copyright Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2017
Copyright_xml – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2017
DBID 97E
RIA
RIE
AAYXX
CITATION
7SP
7U5
8FD
L7M
DOI 10.1109/TPS.2017.2727542
DatabaseName IEEE All-Society Periodicals Package (ASPP) 2005–Present
IEEE All-Society Periodicals Package (ASPP) 1998–Present
IEEE Electronic Library (IEL)
CrossRef
Electronics & Communications Abstracts
Solid State and Superconductivity Abstracts
Technology Research Database
Advanced Technologies Database with Aerospace
DatabaseTitle CrossRef
Solid State and Superconductivity Abstracts
Technology Research Database
Advanced Technologies Database with Aerospace
Electronics & Communications Abstracts
DatabaseTitleList Solid State and Superconductivity Abstracts

Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library (IEL)
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Applied Sciences
Physics
EISSN 1939-9375
EndPage 2595
ExternalDocumentID 10_1109_TPS_2017_2727542
8008819
Genre orig-research
GrantInformation_xml – fundername: National Natural Science Foundation of China
  grantid: 51407129
  funderid: 10.13039/501100001809
– fundername: State Key Laboratory of Electrical Insulation and Power Equipment Fund
  grantid: EIPE17208; EIPE15211
GroupedDBID -~X
.DC
0R~
29I
4.4
53G
5GY
5VS
6IK
97E
AAJGR
AARMG
AASAJ
AAWTH
ABAZT
ABQJQ
ABVLG
ACGFO
ACGFS
ACGOD
ACIWK
ACNCT
AENEX
AETIX
AGQYO
AGSQL
AHBIQ
AI.
AIBXA
AKJIK
AKQYR
ALLEH
ALMA_UNASSIGNED_HOLDINGS
ASUFR
ATWAV
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CS3
DU5
EBS
EJD
HZ~
H~9
IAAWW
IBMZZ
ICLAB
IFIPE
IFJZH
IPLJI
JAVBF
LAI
M43
MS~
O9-
OCL
P2P
PQQKQ
RIA
RIE
RNS
TAE
TN5
TWZ
VH1
AAYXX
CITATION
RIG
7SP
7U5
8FD
L7M
ID FETCH-LOGICAL-c361t-3078f2f150196c0e921770fe274aecdce48cbdb46fea30bebc55c06c0629966d3
IEDL.DBID RIE
ISSN 0093-3813
IngestDate Sun Jun 29 16:56:41 EDT 2025
Tue Jul 01 02:30:17 EDT 2025
Thu Apr 24 23:04:08 EDT 2025
Tue Aug 26 16:43:27 EDT 2025
IsPeerReviewed true
IsScholarly true
Issue 9
Language English
License https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c361t-3078f2f150196c0e921770fe274aecdce48cbdb46fea30bebc55c06c0629966d3
Notes ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 14
ORCID 0000-0001-5831-5097
PQID 1936238241
PQPubID 36903
PageCount 8
ParticipantIDs proquest_journals_1936238241
crossref_citationtrail_10_1109_TPS_2017_2727542
ieee_primary_8008819
crossref_primary_10_1109_TPS_2017_2727542
ProviderPackageCode CITATION
AAYXX
PublicationCentury 2000
PublicationDate 2017-09-01
PublicationDateYYYYMMDD 2017-09-01
PublicationDate_xml – month: 09
  year: 2017
  text: 2017-09-01
  day: 01
PublicationDecade 2010
PublicationPlace New York
PublicationPlace_xml – name: New York
PublicationTitle IEEE transactions on plasma science
PublicationTitleAbbrev TPS
PublicationYear 2017
Publisher IEEE
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher_xml – name: IEEE
– name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
References ref13
latham (ref1) 1995
ref12
ref15
ref14
kolyada (ref18) 2000
ref11
slade (ref7) 2008
mandelbrot (ref9) 1977
ref2
ref16
ref19
ref8
li (ref4) 2001; 29
ref3
mandelbrot (ref10) 1982
ref5
keil (ref17) 1984
rohrbach (ref6) 1971
References_xml – start-page: 3
  year: 1984
  ident: ref17
  publication-title: ElektrischeKontakte und ihreWerkstoffe
– ident: ref8
  doi: 10.1126/science.156.3775.636
– ident: ref13
  doi: 10.1016/S0045-7930(01)00105-0
– start-page: 38
  year: 1971
  ident: ref6
  article-title: Mechanism which leads to the formation of an electric spark at very high voltage and under ultra-vacuum for the measurement of the delay time of the disruption
– volume: 29
  start-page: 744
  year: 2001
  ident: ref4
  article-title: Effects of Cr content on the interruption ability of CuCr contact materials
  publication-title: IEEE Trans Plasma Sci
  doi: 10.1109/27.964467
– ident: ref5
  doi: 10.1109/TDEI.2016.006028
– ident: ref19
  doi: 10.1063/1.1703148
– start-page: 230
  year: 1995
  ident: ref1
  publication-title: High Voltage Vacuum Insulations Basic Concepts and Technological Practice
– year: 1977
  ident: ref9
  publication-title: Fractals Form Chance and Dimension
– ident: ref16
  doi: 10.1109/TDEI.2011.6118653
– year: 1982
  ident: ref10
  publication-title: The Fractal Geometry of Nature
– ident: ref14
  doi: 10.1109/DEIV.2006.357224
– start-page: 68
  year: 2000
  ident: ref18
  article-title: Aerosol micro-particles and emission characteristics of the pulsed high-current vacuum diode in a microsecond range
  publication-title: Proc 17th Int Symp Discharges Elec Insul in Vacuum
– ident: ref11
  doi: 10.1080/10402000903502261
– ident: ref12
  doi: 10.1109/TDEI.2017.006364
– ident: ref15
  doi: 10.1109/TDEI.2009.5361595
– ident: ref3
  doi: 10.1109/DEIV.1996.545312
– ident: ref2
  doi: 10.1063/1.1702243
– start-page: 49
  year: 2008
  ident: ref7
  publication-title: The Vacuum Interrupter Theory Design and Application
SSID ssj0014502
Score 2.2208624
Snippet The objective of this paper is to study the influence of microscopic electric field enhancement caused by microprotrusions on microparticle impact phenomena...
SourceID proquest
crossref
ieee
SourceType Aggregation Database
Enrichment Source
Index Database
Publisher
StartPage 2588
SubjectTerms Computational fluid dynamics
Computer simulation
Copper
Craters
Distortion
Electric contacts
Electric fields
Fluid flow
Fractal models
Fractal theory
Fractals
Hydrodynamics
impact phenomena
microparticle
Microparticles
microprotrusion
microscopic electric field
Microscopy
Modelling
Smooth particle hydrodynamics
Studies
Vacuum breakdown
Title Influence of Microscopic Electric Field Enhancement on Microparticle Impact Phenomena Based on Fractal Modeling
URI https://ieeexplore.ieee.org/document/8008819
https://www.proquest.com/docview/1936238241
Volume 45
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LS8NAEB60IHixahWrVfbgRTDtmneOKi2toAhW8Baykw2KkhTbXvz1zmw2BR-Ih8AeZjcLM5v5JvvNDMBp6EWEO4PMId3njo8SHZV7kUNgHCngisjJGoLsXTh-9G-egqc1OF_lwmitDflM93lo7vLzCpf8q2xA4CaOucbnOplZnau1ujHwA1lXBk88h7yQ11xJymQwvX9gDlfUd8lZB777xQWZnio_PsTGu4zacNvsqyaVvPaXC9XHj28lG_-78W3YsjBTXNZ2sQNrutyFtoWcwh7o-S5sGAYozjtQTZp2JaIqxC3z9Dhj5QXF0HTKocGI2W5iWD6zpfAbRVXWkjNrgGJiki7F_bMuubRDJq7IS-YsN-J0LNoSN1_jFPg9eBwNp9djx3ZjcNALLxb8kyou3IIAJB1alDqhYCaShaawNtOYo_ZjVLnyw0JnnlRaYRCgJMnQ5Zgq9_ahVValPgDhJqGiNfNMIfoYR0qSp6YnoeAn87OLLgwaBaVoS5Vzx4y31IQsMklJpSmrNLUq7cLZasasLtPxh2yHNbSSs8rpQq-xgdSe43lK8JbwYUww5_D3WUewyWvXrLMetBbvS31MMGWhTox9fgLn_uO7
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LS8NAEB5EEb34FutzD14E065556jS0qoVwQreQnayQVESse3FX-_MZlPwgXgI7GE2uzCzmW-y38wAHIdeRLgzyBzSfe74KNFRuRc5BMaRAq6InKwhyN6G_Qf_6jF4nIPTWS6M1tqQz3Sbh-YuP69wyr_KOgRu4phrfC4EFFXEdbbW7M7AD2RdGzzxHPJDXnMpKZPO6O6eWVxR2yV3HfjuFydkuqr8-BQb_9JbhWGzs5pW8tKeTlQbP74Vbfzv1tdgxQJNcV5bxjrM6XIDVi3oFPZIjzdg0XBAcbwJ1aBpWCKqQgyZqcc5K88ouqZXDg16zHcT3fKJbYVXFFVZS75ZExQDk3Yp7p50ycUdMnFBfjJnuR4nZNGWuP0aJ8FvwUOvO7rsO7Yfg4NeeDbh31Rx4RYEIenYotQJhTORLDQFtpnGHLUfo8qVHxY686TSCoMAJUmGLkdVubcN82VV6h0QbhIqemeeKUQf40hJ8tX0JBT-ZH521oJOo6AUbbFy7pnxmpqgRSYpqTRllaZWpS04mc14qwt1_CG7yRqayVnltGC_sYHUnuRxSgCXEGJMQGf391lHsNQfDW_Sm8Ht9R4s8zo1B20f5ifvU31AoGWiDo2tfgIJSOcO
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Influence+of+Microscopic+Electric+Field+Enhancement+on+Microparticle+Impact+Phenomena+Based+on+Fractal+Modeling&rft.jtitle=IEEE+transactions+on+plasma+science&rft.au=Zhang%2C+Yingyao&rft.au=Xu%2C+Xinye&rft.au=Jin%2C+Lijun&rft.au=An%2C+Zhenlian&rft.date=2017-09-01&rft.issn=0093-3813&rft.eissn=1939-9375&rft.volume=45&rft.issue=9&rft.spage=2588&rft.epage=2595&rft_id=info:doi/10.1109%2FTPS.2017.2727542&rft.externalDBID=n%2Fa&rft.externalDocID=10_1109_TPS_2017_2727542
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0093-3813&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0093-3813&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0093-3813&client=summon