Fitting the Reduced RUM with Mplus: A Tutorial - Chiu, Chia-Yi; Köhn, Hans-Friedrich; Wu, Huey-Min (International journal of testing, 2016)
Keywords: Algorithms; Bayesian Statistics; Classification; cognitive diagnosis; Computation; Computer Software; diagnostic models; Economic models; Educational Assessment; Educational Diagnosis; Equations (Mathematics); Fitting; general cognitive; Item Response Theory; Latent class analysis; LCDM; Mathematics; Maximum likelihood method; Maximum Likelihood Statistics; MCMC; Mplus; Multivariate Analysis; Parameters; Psychometrics; reduced RUM EM; Tutorial Programs