Beyond Eliminating Timing Margin: An Efficient and Reliable Negative Margin Timing Error Detection for Neural Network Accelerator Without Accuracy Loss - Shen, Zhengguo; Shan, Weiwei; Du, Yuxuan; Li, Ziyu; Yang, Jun (IEEE journal of solid-state circuits, 2023)
Keywords: Adders; Artificial neural networks; Energy-efficient; Error correction; Error correction & detection; Error detection; Integrated circuit reliability; miss detection; Monitoring; negative margin; Neural networks; Registers; Switches; Threshold voltage; Timing; timing error detection; Transistors; transition detector (TD); Transmission gates