Shavezipur, M., Gou, W., Carraro, C., & Maboudian, R. (2012). Characterization of Adhesion Force in MEMS at High Temperature Using Thermally Actuated Microstructures. Journal of microelectromechanical systems, 21(3), 541-548. https://doi.org/10.1109/JMEMS.2012.2189363
Chicago Style (17th ed.) CitationShavezipur, M., Wenjuan Gou, C. Carraro, and R. Maboudian. "Characterization of Adhesion Force in MEMS at High Temperature Using Thermally Actuated Microstructures." Journal of Microelectromechanical Systems 21, no. 3 (2012): 541-548. https://doi.org/10.1109/JMEMS.2012.2189363.
MLA (9th ed.) CitationShavezipur, M., et al. "Characterization of Adhesion Force in MEMS at High Temperature Using Thermally Actuated Microstructures." Journal of Microelectromechanical Systems, vol. 21, no. 3, 2012, pp. 541-548, https://doi.org/10.1109/JMEMS.2012.2189363.