王玮, 王. 马. 过. 张. (2011). Measurements of electron-phonon coupling factor and interfacial thermal resistance of metallic nano-films using a transient thermoreflectance technique. Chinese physics B, 20(4), 209-216. https://doi.org/10.1088/1674-1056/20/4/040701
Chicago Style (17th ed.) Citation王玮, 王海东 马维刚 过增元 张兴. "Measurements of Electron-phonon Coupling Factor and Interfacial Thermal Resistance of Metallic Nano-films Using a Transient Thermoreflectance Technique." Chinese Physics B 20, no. 4 (2011): 209-216. https://doi.org/10.1088/1674-1056/20/4/040701.
MLA (9th ed.) Citation王玮, 王海东 马维刚 过增元 张兴. "Measurements of Electron-phonon Coupling Factor and Interfacial Thermal Resistance of Metallic Nano-films Using a Transient Thermoreflectance Technique." Chinese Physics B, vol. 20, no. 4, 2011, pp. 209-216, https://doi.org/10.1088/1674-1056/20/4/040701.