Genesys-Pro: innovations in test program generation for functional processor verification

Functional verification is widely recognized as the bottleneck of the hardware design cycle. With the ever-growing demand for greater performance and faster time to market, coupled with the exponential growth in hardware size, verification has become increasingly difficult. Although formal methods s...

Full description

Saved in:
Bibliographic Details
Published inIEEE design & test of computers Vol. 21; no. 2; pp. 84 - 93
Main Authors Adir, A., Almog, E., Fournier, L., Marcus, E., Rimon, M., Vinov, M., Ziv, A.
Format Journal Article
LanguageEnglish
Published IEEE Computer Society 01.03.2004
Subjects
Online AccessGet full text
ISSN0740-7475
DOI10.1109/MDT.2004.1277900

Cover

Abstract Functional verification is widely recognized as the bottleneck of the hardware design cycle. With the ever-growing demand for greater performance and faster time to market, coupled with the exponential growth in hardware size, verification has become increasingly difficult. Although formal methods such as model checking and theorem proving have resulted in noticeable progress, these approaches apply only to the verification of relatively small design blocks or to very focused verification goals. Current industry practice is to use separate, automatic, random stimuli generators for processor- and multiprocessor-level verification. The generated stimuli, usually in the form of test programs, trigger architecture and microarchitecture events defined by a verification plan. MAC-based algorithms are well suited for the test program generation domain because they postpone heuristic decisions until after consideration of all architectural and testing-knowledge constraints. Geneysys-Pro is currently the main test generation tool for functional verification of IBM processors, including several complex processors. We've found that the new language considerably reduces the effort needed to define and maintain knowledge specific to an implementation and verification plan.
AbstractList Functional verification is widely recognized as the bottleneck of the hardware design cycle. With the ever-growing demand for greater performance and faster time to market, coupled with the exponential growth in hardware size, verification has become increasingly difficult. Although formal methods such as model checking and theorem proving have resulted in noticeable progress, these approaches apply only to the verification of relatively small design blocks or to very focused verification goals. Current industry practice is to use separate, automatic, random stimuli generators for processor- and multiprocessor-level verification. The generated stimuli, usually in the form of test programs, trigger architecture and microarchitecture events defined by a verification plan. MAC-based algorithms are well suited for the test program generation domain because they postpone heuristic decisions until after consideration of all architectural and testing-knowledge constraints. Geneysys-Pro is currently the main test generation tool for functional verification of IBM processors, including several complex processors. We've found that the new language considerably reduces the effort needed to define and maintain knowledge specific to an implementation and verification plan.
Author Rimon, M.
Marcus, E.
Vinov, M.
Almog, E.
Ziv, A.
Adir, A.
Fournier, L.
Author_xml – sequence: 1
  givenname: A.
  surname: Adir
  fullname: Adir, A.
  organization: IBM Res. Lab., Haifa, Israel
– sequence: 2
  givenname: E.
  surname: Almog
  fullname: Almog, E.
  organization: IBM Res. Lab., Haifa, Israel
– sequence: 3
  givenname: L.
  surname: Fournier
  fullname: Fournier, L.
  organization: IBM Res. Lab., Haifa, Israel
– sequence: 4
  givenname: E.
  surname: Marcus
  fullname: Marcus, E.
  organization: IBM Res. Lab., Haifa, Israel
– sequence: 5
  givenname: M.
  surname: Rimon
  fullname: Rimon, M.
  organization: IBM Res. Lab., Haifa, Israel
– sequence: 6
  givenname: M.
  surname: Vinov
  fullname: Vinov, M.
  organization: IBM Res. Lab., Haifa, Israel
– sequence: 7
  givenname: A.
  surname: Ziv
  fullname: Ziv, A.
  organization: IBM Res. Lab., Haifa, Israel
BookMark eNp9kLtPwzAQxj0UiRbYkVgyIZaU8yN2woZ4FKQiGMrAFLmOXRmldrHTSv3vcdpKSAyd7vX7TnffCA2cdxqhSwxjjKG6fXucjQkAG2MiRAUwQEMQDHLBRHGKRjF-AwDGnA_R10Q7Hbcx_wj-LrPO-Y3srHcx5VmnY5etgl8EucwWCQy7WWZ8yMzaqb6QbU8oHWNqbnSwxqoddY5OjGyjvjjEM_T5_DR7eMmn75PXh_tprmhBulwXlKgSsMKcNnhemEaVhoNsClJiwFwzZsqKCSp5U5UUGDQYJ4hyouaUAj1D1_u96Yyfdbq4XtqodNtKp_061qQUhahED94cBTEXmJQMeJFQvkdV8DEGbWplu91XXZC2rTHUvdF1Mrruja4PRich_BOugl3KsD0mudpLrNb6Dz9MfwHml41X
CODEN IDTCEC
CitedBy_id crossref_primary_10_1109_TCAD_2022_3178051
crossref_primary_10_1134_S0361768814010046
crossref_primary_10_1587_essfr_15_3_168
crossref_primary_10_1016_j_mejo_2008_05_009
crossref_primary_10_1109_TVLSI_2008_917424
crossref_primary_10_1109_TC_2006_183
crossref_primary_10_3390_mi13111887
crossref_primary_10_1145_1550987_1550995
crossref_primary_10_1109_TDMR_2016_2636880
crossref_primary_10_1109_TVLSI_2017_2658564
crossref_primary_10_3724_SP_J_1089_2010_10996
crossref_primary_10_1007_s11432_020_3308_4
crossref_primary_10_1109_TCAD_2018_2801239
crossref_primary_10_1147_JRD_2011_2178737
crossref_primary_10_1109_TSE_2024_3406900
crossref_primary_10_1016_j_ipl_2017_02_001
crossref_primary_10_1109_MDAT_2017_2691348
crossref_primary_10_23947_2687_1653_2021_21_2_200_206
crossref_primary_10_1109_TCAD_2006_884494
crossref_primary_10_1134_S0361768810010056
crossref_primary_10_1016_j_sysarc_2019_05_007
crossref_primary_10_1109_MDAT_2023_3262741
crossref_primary_10_1109_MDT_2010_28
crossref_primary_10_1109_TC_2018_2868362
crossref_primary_10_1109_TCAD_2012_2189394
crossref_primary_10_1007_s11334_019_00348_0
crossref_primary_10_1145_1367045_1367051
crossref_primary_10_1109_TVLSI_2008_2001134
crossref_primary_10_1147_JRD_2014_2380271
crossref_primary_10_1109_TVLSI_2008_917419
crossref_primary_10_1109_TCAD_2019_2894376
crossref_primary_10_1109_MDAT_2016_2527998
crossref_primary_10_1145_3299710_3211342
crossref_primary_10_1145_3107615
crossref_primary_10_1147_JRD_2017_2721699
Cites_doi 10.1109/HLDVT.2001.972809
10.1109/HLDVT.2003.1252470
10.1145/996566.996578
10.1109/HLDVT.2002.1224433
10.1147/sj.413.0386
10.1109/DAC.2001.935512
10.1109/HLDVT.2003.1252469
10.1145/277044.277208
10.1147/sj.304.0527
10.1109/MTV.2003.1250255
10.1145/307418.307540
10.1109/HLDVT.2002.1224432
ContentType Journal Article
DBID RIA
RIE
AAYXX
CITATION
7SC
7SP
8FD
F28
FR3
JQ2
L7M
L~C
L~D
DOI 10.1109/MDT.2004.1277900
DatabaseName IEEE All-Society Periodicals Package (ASPP) 1998–Present
IEEE Electronic Library (IEL)
CrossRef
Computer and Information Systems Abstracts
Electronics & Communications Abstracts
Technology Research Database
ANTE: Abstracts in New Technology & Engineering
Engineering Research Database
ProQuest Computer Science Collection
Advanced Technologies Database with Aerospace
Computer and Information Systems Abstracts – Academic
Computer and Information Systems Abstracts Professional
DatabaseTitle CrossRef
Technology Research Database
Computer and Information Systems Abstracts – Academic
Electronics & Communications Abstracts
ProQuest Computer Science Collection
Computer and Information Systems Abstracts
Engineering Research Database
Advanced Technologies Database with Aerospace
ANTE: Abstracts in New Technology & Engineering
Computer and Information Systems Abstracts Professional
DatabaseTitleList
Technology Research Database
Computer and Information Systems Abstracts
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library (IEL)
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
EndPage 93
ExternalDocumentID 10_1109_MDT_2004_1277900
1277900
Genre orig-research
GroupedDBID -~X
.DC
0R~
29I
4.4
5GY
5VS
6IK
97E
AAJGR
AASAJ
AAWTH
ABAZT
ABFSI
ABQJQ
ABVLG
ACGFS
AETIX
AFFNX
AGQYO
AGSQL
AHBIQ
AI.
AIBXA
ALLEH
ALMA_UNASSIGNED_HOLDINGS
ATWAV
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CS3
DU5
E.L
EBS
EJD
HZ~
H~9
IBMZZ
ICLAB
IEDLZ
IFIPE
IFJZH
IPLJI
JAVBF
LAI
M43
O9-
OCL
P2P
RIA
RIE
RNI
RNS
RZB
TN5
VH1
ZY4
AAYXX
CITATION
7SC
7SP
8FD
F28
FR3
JQ2
L7M
L~C
L~D
ID FETCH-LOGICAL-c352t-e532c801c163d1b5fdc8f60ad5281016e44f89473a6d983040d11fdc362cb3303
IEDL.DBID RIE
ISSN 0740-7475
IngestDate Fri Sep 05 05:43:53 EDT 2025
Fri Sep 05 11:06:53 EDT 2025
Wed Oct 01 02:13:38 EDT 2025
Thu Apr 24 23:07:32 EDT 2025
Wed Aug 27 03:06:14 EDT 2025
IsPeerReviewed false
IsScholarly false
Issue 2
Language English
License https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c352t-e532c801c163d1b5fdc8f60ad5281016e44f89473a6d983040d11fdc362cb3303
Notes ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 23
ObjectType-Article-2
ObjectType-Feature-1
PQID 1671284065
PQPubID 23500
PageCount 10
ParticipantIDs proquest_miscellaneous_28757970
ieee_primary_1277900
crossref_citationtrail_10_1109_MDT_2004_1277900
proquest_miscellaneous_1671284065
crossref_primary_10_1109_MDT_2004_1277900
ProviderPackageCode CITATION
AAYXX
PublicationCentury 2000
PublicationDate 2004-03-01
PublicationDateYYYYMMDD 2004-03-01
PublicationDate_xml – month: 03
  year: 2004
  text: 2004-03-01
  day: 01
PublicationDecade 2000
PublicationTitle IEEE design & test of computers
PublicationTitleAbbrev MDT
PublicationYear 2004
Publisher IEEE Computer Society
Publisher_xml – name: IEEE Computer Society
References ref13
ref15
ref14
aharon (ref7) 1994
ref11
haque (ref4) 2001
ref10
ref2
clarke (ref1) 1999
ref16
hartman (ref12) 1999
ref8
ref9
ref3
ref6
ref5
References_xml – year: 2001
  ident: ref4
  publication-title: The Art of Verification with Vera
– ident: ref15
  doi: 10.1109/HLDVT.2001.972809
– year: 1999
  ident: ref1
  publication-title: Model checking
– ident: ref13
  doi: 10.1109/HLDVT.2003.1252470
– ident: ref9
  doi: 10.1145/996566.996578
– start-page: 83
  year: 1994
  ident: ref7
  article-title: Model-Based Test Generator for Processor Design Verification
  publication-title: Proc 7th Innovative Applications of Artificial Intelligence Conf (IAAI 94)
– ident: ref14
  doi: 10.1109/HLDVT.2002.1224433
– ident: ref8
  doi: 10.1147/sj.413.0386
– ident: ref2
  doi: 10.1109/DAC.2001.935512
– ident: ref11
  doi: 10.1109/HLDVT.2003.1252469
– ident: ref3
  doi: 10.1145/277044.277208
– ident: ref6
  doi: 10.1147/sj.304.0527
– ident: ref10
  doi: 10.1109/MTV.2003.1250255
– start-page: 23
  year: 1999
  ident: ref12
  article-title: Short vs. Long?Size Does Make a Difference
  publication-title: Proc IEEE Int High Level Design Validation and Test Workshop (HLDVT)
– ident: ref5
  doi: 10.1145/307418.307540
– ident: ref16
  doi: 10.1109/HLDVT.2002.1224432
SSID ssj0001166
Score 1.5824428
Snippet Functional verification is widely recognized as the bottleneck of the hardware design cycle. With the ever-growing demand for greater performance and faster...
SourceID proquest
crossref
ieee
SourceType Aggregation Database
Enrichment Source
Index Database
Publisher
StartPage 84
SubjectTerms Computer languages
Design engineering
Engines
Formal method
Hardware
Knowledge engineering
Markets
Microprocessors
Power generation
Power system modeling
Recognition
Spine
Stimuli
Technological innovation
Testing
Theorem proving
Title Genesys-Pro: innovations in test program generation for functional processor verification
URI https://ieeexplore.ieee.org/document/1277900
https://www.proquest.com/docview/1671284065
https://www.proquest.com/docview/28757970
Volume 21
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
journalDatabaseRights – providerCode: PRVIEE
  databaseName: IEEE Electronic Library (IEL)
  issn: 0740-7475
  databaseCode: RIE
  dateStart: 19840101
  customDbUrl:
  isFulltext: true
  dateEnd: 20121231
  titleUrlDefault: https://ieeexplore.ieee.org/
  omitProxy: false
  ssIdentifier: ssj0001166
  providerName: IEEE
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LSwMxEA61Jz34qmJ9RvAiuNt9ZB_xJmopQsVDC_W0bB4rorSl3R701zuTffgWbyE7WUImyXyTTL4h5ESBniPfiywmMIWZI5UlYJpYksN26AuWcZN5rn8b9obsZhSMGuSsfgujtTbBZ9rGornLVxO5wKOyjushOx446EtRHBZvtepd13WLe8kII-RYFFRXkg7v9K8GxhG0y_afTJDJqfJtIzbWpbtG-lW_iqCSJ3uRC1u-fqFs_G_H18lqCTPpRTEvNkhDjzfJygfywRa5R8bp-cvcuptNzuljnR11DmUKADSnZewWfTDU1PiNAsSlaAqLE0Q6LZ4ZQCWsCAw6MlJbZNi9Hlz2rDLRgiUBf-WWDnxPgm4kgDPliiBTMs5CJ1WBh_xfoWYsizmL_DRUPPZh3SvXBSEwflL4YAS3SXM8GesdQgPEkL4jwM2SLOV-KoSnvSzlsQLXKHPapFONfSJLFnJMhvGcGG_E4QloC3NjsqQctDY5rVtMCwaOP2RbOPjvclX1caXeBFYPXomkYz1ZzBM3jNBAAw5rk6NfZDzk_OeRs_vzz_fIchHNg3Fp-6SZzxb6AIBKLg7NDH0DXzPkHQ
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3JTsMwEB1VcAAO7IiyGokLEmmzOEnNDbGoQIs4FAlOUbwEIVCLaHqAr2fGScqOuFnOxLI8tueNPX4DsKtRz3Hgxw6XlMLMVdqROE0cJXA7DCTPhM08172M2tf8_Ca8qcH--C2MMcYGn5kGFe1dvh6oER2VNT2f2PHQQZ8MOedh8VprvO96XnEzGVOMHI_D6lLSFc3ucc-6go2yhU9GyGZV-bYVW_tyOgfdqmdFWMlDY5TLhnr9Qtr4367Pw2wJNNlhMTMWoGb6izDzgX5wCW6Jc3r4MnSungcH7H6cH3WIZYYQNGdl9Ba7s-TU9I0hyGVkDIszRPZUPDTASlwTFHZkpZbh-vSkd9R2ylQLjkIEljsmDHyF2lEIz7Qnw0yrVha5qQ59YgCLDOdZS_A4SCMtWgGufO15KITmT8kAzeAKTPQHfbMKLCQUGbgSHS3FUxGkUvrGz1LR0ugcZW4dmtXYJ6rkIad0GI-J9UdckaC2KDsmT8pBq8Pe-I-ngoPjD9klGvx3uap6p1JvguuHLkXSvhmMhokXxWSiEYnVYfsXGZ9Y_0Xsrv3c-DZMtXvdTtI5u7xYh-kitoei1DZgIn8emU2ELbncsrP1DXYq52o
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Genesys-pro%3A+innovations+in+test+program+generation+for+functional+processor+verification&rft.jtitle=IEEE+design+%26+test+of+computers&rft.au=Adir%2C+A.&rft.au=Almog%2C+E.&rft.au=Fournier%2C+L.&rft.au=Marcus%2C+E.&rft.date=2004-03-01&rft.issn=0740-7475&rft.volume=21&rft.issue=2&rft.spage=84&rft.epage=93&rft_id=info:doi/10.1109%2FMDT.2004.1277900&rft.externalDBID=n%2Fa&rft.externalDocID=10_1109_MDT_2004_1277900
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0740-7475&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0740-7475&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0740-7475&client=summon