A Generalized Fault Coverage Model for Linear Time-Invariant Systems

This paper proposes a fault coverage model for linear time-invariant (LTI) systems subject to uncertain input. A state-space representation, defined by the state-transition matrix, and the input matrix, is used to represent LTI system dynamic behavior. The uncertain input is considered to be unknown...

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Published inIEEE transactions on reliability Vol. 58; no. 3; pp. 553 - 567
Main Authors Dominguez-Garcia, A.D., Kassakian, J.G., Schindall, J.E.
Format Journal Article
LanguageEnglish
Published New York IEEE 01.09.2009
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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ISSN0018-9529
1558-1721
DOI10.1109/TR.2009.2019496

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Abstract This paper proposes a fault coverage model for linear time-invariant (LTI) systems subject to uncertain input. A state-space representation, defined by the state-transition matrix, and the input matrix, is used to represent LTI system dynamic behavior. The uncertain input is considered to be unknown but bounded, where the bound is defined by an ellipsoid. The state-transition matrix, and the input matrix must be such that, for any possible input, the system dynamics meets its intended function, which can be defined by some performance requirements. These performance requirements constrain the system trajectories to some region of the state-space defined by a symmetrical polytope. When a fault occurs, the state-transition matrix, and the input matrix might be altered; and then, it is guaranteed the system survives the fault if all possible post-fault trajectories are fully contained in the region of the state-space defined by the performance requirements. This notion of guaranteed survivability is the basis to model (in the context of LTI systems) the concept of fault coverage, which is a probabilistic measure of the ability of the system to keep delivering its intended function after a fault. Analytical techniques to obtain estimates of the proposed fault coverage model are presented. To illustrate the application of the proposed model, two examples are discussed.
AbstractList When a fault occurs, the state-transition matrix, and the input matrix might be altered; and then, it is guaranteed the system survives the fault if all possible post-fault trajectories are fully contained in the region of the state-space defined by the performance requirements.
This paper proposes a fault coverage model for linear time-invariant (LTI) systems subject to uncertain input. A state-space representation, defined by the state-transition matrix, and the input matrix, is used to represent LTI system dynamic behavior. The uncertain input is considered to be unknown but bounded, where the bound is defined by an ellipsoid. The state-transition matrix, and the input matrix must be such that, for any possible input, the system dynamics meets its intended function, which can be defined by some performance requirements. These performance requirements constrain the system trajectories to some region of the state-space defined by a symmetrical polytope. When a fault occurs, the state-transition matrix, and the input matrix might be altered; and then, it is guaranteed the system survives the fault if all possible post-fault trajectories are fully contained in the region of the state-space defined by the performance requirements. This notion of guaranteed survivability is the basis to model (in the context of LTI systems) the concept of fault coverage, which is a probabilistic measure of the ability of the system to keep delivering its intended function after a fault. Analytical techniques to obtain estimates of the proposed fault coverage model are presented. To illustrate the application of the proposed model, two examples are discussed.
Author Dominguez-Garcia, A.D.
Kassakian, J.G.
Schindall, J.E.
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Cites_doi 10.13182/NSE92-A23937
10.1145/800195.805940
10.1109/12.24286
10.1109/12.238482
10.1007/978-1-4612-0277-6
10.1109/T-C.1973.223703
10.1109/TR.1983.5221731
10.1109/TR.1987.5222318
10.1109/12.980013
10.1137/S1052623401399903
10.1007/978-1-4615-4381-7_16
10.1109/CMPASS.1994.318463
10.1007/978-1-84800-155-8_7
10.1017/CBO9780511804441
10.1109/2.585157
10.1109/24.475993
10.1109/INTLEC.1989.88272
10.1137/1.9781611970777
10.1016/S0951-8320(00)00017-X
10.1023/B:JOTA.0000015683.35168.bf
10.1137/S0036144504440543
10.1016/S0005-1098(99)00113-2
10.1109/12.364537
10.13182/NSE81-A19840
10.1080/1055678021000012426
10.1109/12.780878
10.1016/0951-8320(95)00135-2
10.1109/ARMS.1991.154462
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References ref35
ref13
strm (ref32) 1970
ref34
ref12
ref36
ref14
chernousko (ref24) 1999
ref11
ref10
ref2
ref39
ref17
ref19
kendall (ref27) 1961
amendola (ref16) 1981; 77
bertsimas (ref33) 2000; 27
grant (ref30) 2008
(ref15) 1979
ref26
ref25
ref20
schweppe (ref22) 1973
grimmett (ref31) 2001
ref21
(ref7) 1995
babcock (ref38) 1986
ref28
ref29
devooght (ref18) 1992; 111
ref8
ref9
ref4
ref3
ref6
(ref1) 1991
rausand (ref37) 2004
stiffler (ref5) 1982
ref40
kurzhanski (ref23) 1997
References_xml – volume: 111
  start-page: 229
  year: 1992
  ident: ref18
  article-title: probabilistic reactor dynamics-i: the theory of continuos event trees
  publication-title: Nuclear Science and Engineering
  doi: 10.13182/NSE92-A23937
– year: 1986
  ident: ref38
  publication-title: An Introduction to Reliability Modeling of Fault-Tolerant Systems
– ident: ref2
  doi: 10.1145/800195.805940
– year: 2008
  ident: ref30
  publication-title: MATLAB Software for Disciplined Convex Programming
– year: 1995
  ident: ref7
  publication-title: Fault-Tolerant Computer System Design
– ident: ref4
  doi: 10.1109/12.24286
– ident: ref9
  doi: 10.1109/12.238482
– start-page: 127
  year: 1999
  ident: ref24
  publication-title: Whys and Hows in Uncertainty Modelling Probability Fuzziness and Anti-Optimization
– year: 1961
  ident: ref27
  publication-title: A Course in the Geometry of n-Dimensions
– year: 1997
  ident: ref23
  publication-title: Ellipsoidal Calculus for Estimation and Control
  doi: 10.1007/978-1-4612-0277-6
– ident: ref3
  doi: 10.1109/T-C.1973.223703
– ident: ref6
  doi: 10.1109/TR.1983.5221731
– year: 1973
  ident: ref22
  publication-title: Uncertain Dynamic Systems
– ident: ref17
  doi: 10.1109/TR.1987.5222318
– year: 2004
  ident: ref37
  publication-title: System Reliability Theory
– ident: ref12
  doi: 10.1109/12.980013
– ident: ref40
  doi: 10.1137/S1052623401399903
– volume: 27
  start-page: 469
  year: 2000
  ident: ref33
  publication-title: Handbook of Semidefinite Programming
  doi: 10.1007/978-1-4615-4381-7_16
– ident: ref13
  doi: 10.1109/CMPASS.1994.318463
– ident: ref36
  doi: 10.1007/978-1-84800-155-8_7
– ident: ref29
  doi: 10.1017/CBO9780511804441
– ident: ref8
  doi: 10.1109/2.585157
– ident: ref14
  doi: 10.1109/24.475993
– year: 2001
  ident: ref31
  publication-title: Probability and Random Processes
– ident: ref35
  doi: 10.1109/INTLEC.1989.88272
– ident: ref28
  doi: 10.1137/1.9781611970777
– year: 1991
  ident: ref1
  publication-title: Dependability Basic Concepts and Terminology
– ident: ref20
  doi: 10.1016/S0951-8320(00)00017-X
– ident: ref25
  doi: 10.1023/B:JOTA.0000015683.35168.bf
– year: 1982
  ident: ref5
  publication-title: Care III phase I report-mathematical description
– ident: ref34
  doi: 10.1137/S0036144504440543
– year: 1970
  ident: ref32
  publication-title: Introduction to Stochastic Control Theory
– ident: ref26
  doi: 10.1016/S0005-1098(99)00113-2
– ident: ref10
  doi: 10.1109/12.364537
– volume: 77
  start-page: 297
  year: 1981
  ident: ref16
  article-title: event sequences and consequence spectrum: a methodology for probabilistic transient analysis
  publication-title: Nuclear Science An Engineering
  doi: 10.13182/NSE81-A19840
– ident: ref21
  doi: 10.1080/1055678021000012426
– ident: ref11
  doi: 10.1109/12.780878
– ident: ref19
  doi: 10.1016/0951-8320(95)00135-2
– ident: ref39
  doi: 10.1109/ARMS.1991.154462
– year: 1979
  ident: ref15
  publication-title: Introduction to Dynamic Systems
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Snippet This paper proposes a fault coverage model for linear time-invariant (LTI) systems subject to uncertain input. A state-space representation, defined by the...
When a fault occurs, the state-transition matrix, and the input matrix might be altered; and then, it is guaranteed the system survives the fault if all...
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SubjectTerms Aircraft navigation
Automotive engineering
Context modeling
Convex optimization
Dynamical systems
Dynamics
Ellipsoids
fault coverage
Fault detection
Faults
invariant sets
linear time-invariant systems
Markov reliability modeling
Mathematical analysis
Mathematical models
Redundancy
Risk management
Studies
Symmetric matrices
System dynamics
Systems engineering and theory
Trajectories
Vehicle dynamics
Title A Generalized Fault Coverage Model for Linear Time-Invariant Systems
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