Scan architecture with mutually exclusive scan segment activation for shift- and capture-power reduction - Rosinger, P.; Al-Hashimi, B.M.; Nicolici, N. (IEEE transactions on computer-aided design of integrated circuits and systems, 2004)
Keywords: Activation; Algorithms; Architecture; Automatic test pattern generation; Automatic testing; Circuit testing; Clocks; Density; Design engineering; Flip-flops; Logic testing; Partitioning algorithms; Power dissipation; Reduction; Segments; Studies; Switches; Voltage