Wan, W., Chen, J., Zhou, Z., & Shi, Z. (2024). Self-Supervised Simple Siamese Framework for Fault Diagnosis of Rotating Machinery With Unlabeled Samples. IEEE transaction on neural networks and learning systems, 35(5), 6380-6392. https://doi.org/10.1109/TNNLS.2022.3209332
Chicago Style (17th ed.) CitationWan, Wenqing, Jinglong Chen, Zitong Zhou, and Zhen Shi. "Self-Supervised Simple Siamese Framework for Fault Diagnosis of Rotating Machinery With Unlabeled Samples." IEEE Transaction on Neural Networks and Learning Systems 35, no. 5 (2024): 6380-6392. https://doi.org/10.1109/TNNLS.2022.3209332.
MLA (9th ed.) CitationWan, Wenqing, et al. "Self-Supervised Simple Siamese Framework for Fault Diagnosis of Rotating Machinery With Unlabeled Samples." IEEE Transaction on Neural Networks and Learning Systems, vol. 35, no. 5, 2024, pp. 6380-6392, https://doi.org/10.1109/TNNLS.2022.3209332.