APA (7th ed.) Citation

Santana, M., Keo, P., & Hjiaj, M. (2022). Efficient and low memory strain-rate independent return mapping algorithm for general yield surfaces and stress states. Advances in engineering software (1992), 164, 103067. https://doi.org/10.1016/j.advengsoft.2021.103067

Chicago Style (17th ed.) Citation

Santana, M.V.B, P. Keo, and M. Hjiaj. "Efficient and Low Memory Strain-rate Independent Return Mapping Algorithm for General Yield Surfaces and Stress States." Advances in Engineering Software (1992) 164 (2022): 103067. https://doi.org/10.1016/j.advengsoft.2021.103067.

MLA (9th ed.) Citation

Santana, M.V.B, et al. "Efficient and Low Memory Strain-rate Independent Return Mapping Algorithm for General Yield Surfaces and Stress States." Advances in Engineering Software (1992), vol. 164, 2022, p. 103067, https://doi.org/10.1016/j.advengsoft.2021.103067.