Photoinduced Processes in Silicon Nanoparticles
Silicon nanocrystals have been prepared from gas‐phase pyrolysis and electrochemical etching of silicon. Confocal and wide‐field optical microscopy have been performed on size‐selected ensembles and single silicon nanocrystals. Single particles exhibit photoluminescence blinking effects that are int...
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| Published in | Israel journal of chemistry Vol. 44; no. 4; pp. 341 - 351 |
|---|---|
| Main Authors | , , , , |
| Format | Journal Article |
| Language | English |
| Published |
Weinheim
WILEY-VCH Verlag
01.12.2004
WILEY‐VCH Verlag |
| Online Access | Get full text |
| ISSN | 0021-2148 1869-5868 |
| DOI | 10.1560/WBD9-DN73-KEHX-8DNL |
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| Abstract | Silicon nanocrystals have been prepared from gas‐phase pyrolysis and electrochemical etching of silicon. Confocal and wide‐field optical microscopy have been performed on size‐selected ensembles and single silicon nanocrystals. Single particles exhibit photoluminescence blinking effects that are interrelated with photo‐induced (reversible) bleaching effects of the ensemble. The blinking dynamics follow a power law statistic of on‐ and off‐times, revealing that even single nanoparticles are subject to strong disorder effects. This is supported by optically detected magnetic resonance (ODMR) experiments on silicon nanoparticles achieved for the first time via microscopic techniques. |
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| AbstractList | Silicon nanocrystals have been prepared from gas‐phase pyrolysis and electrochemical etching of silicon. Confocal and wide‐field optical microscopy have been performed on size‐selected ensembles and single silicon nanocrystals. Single particles exhibit photoluminescence blinking effects that are interrelated with photo‐induced (reversible) bleaching effects of the ensemble. The blinking dynamics follow a power law statistic of on‐ and off‐times, revealing that even single nanoparticles are subject to strong disorder effects. This is supported by optically detected magnetic resonance (ODMR) experiments on silicon nanoparticles achieved for the first time via microscopic techniques. |
| Author | Cichos, Frank Martin, JÖRg Chan, Iu Y. Borczyskowski, Christian Von Huisken, Friedrich |
| Author_xml | – sequence: 1 givenname: JÖRg surname: Martin fullname: Martin, JÖRg organization: Institute of Physics and Center for Nanostructured Materials and Analytics (NanoMA), Chemnitz University of Technology, 09107 Chemnitz, Germany – sequence: 2 givenname: Frank surname: Cichos fullname: Cichos, Frank organization: Institute of Physics and Center for Nanostructured Materials and Analytics (NanoMA), Chemnitz University of Technology, 09107 Chemnitz, Germany – sequence: 3 givenname: Iu Y. surname: Chan fullname: Chan, Iu Y. organization: Institute of Physics and Center for Nanostructured Materials and Analytics (NanoMA), Chemnitz University of Technology, 09107 Chemnitz, Germany – sequence: 4 givenname: Friedrich surname: Huisken fullname: Huisken, Friedrich organization: Department of Physics, Jena University, Germany – sequence: 5 givenname: Christian Von surname: Borczyskowski fullname: Borczyskowski, Christian Von email: borczyskowski@physik.tu-chemnitz.de organization: Institute of Physics and Center for Nanostructured Materials and Analytics (NanoMA), Chemnitz University of Technology, 09107 Chemnitz, Germany |
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| CitedBy_id | crossref_primary_10_1021_cm401666a crossref_primary_10_1016_j_jlumin_2012_03_028 crossref_primary_10_1140_epjst_e2007_00105_0 crossref_primary_10_1021_nl0731163 |
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