Understanding the failure mechanisms of microwave bipolar transistors caused by electrostatic discharge - 刘进 陈永光 谭志良 杨洁 张希军 王振兴 (Journal of semiconductors, 2011)
Keywords: Bipolar transistors; Devices; Electrostatic discharges; ESDS; Fatigue failure; Medici; Microwaves; Semiconductor devices; Semiconductors; Simulation; 双极晶体管; 失效机制; 微波; 故障分析; 电子设备; 静电放电