Optimization Method of Integrated Light-Screen Array with External Parameters Based on Genetic Algorithm

• Published in: Wireless communications and mobile computing Vol. 2021; no. 1
• Main Authors: Chen, Rui, Ji, BoWen, Chen, Ding, Duan, ChenXi
• Format: Journal Article
• Language: English
• Published: Oxford Hindawi 2021; John Wiley & Sons, Inc
• Subjects: Accuracy; Airports; Arrays; Calibration; Deviation; Engineering; Genetic algorithms; Light; Machine learning; Optimization; Parameter identification; Parameter sensitivity; Projectiles; Time series; Weapons
• ISSN: 1530-8669; 1530-8677; 1530-8677
• DOI: 10.1155/2021/2953827

Due to the high sensitivity and fast response, the light-screen array measurement principle is suitable for the dynamic parameter measurement of small and fast targets including projectile. Since the spatial structures of the light-screen array determine the measurement accuracy, internal parameters such as the angles between the light-screens are usually calibrated and then directly used in the field. However, the effect of the measuring state is ignored in the test field. This paper takes the integrated light-screen array sky vertical target as the research object, and two rotation angles are introduced as external parameters to describe the deviation between the calibration state and measuring state of the target, so as to optimize the measurement model. Aiming at the problem that the external parameters cannot be measured directly, an external parameter inversion method of machine learning based on a genetic algorithm is designed under a complex engineering model. The deviation between the projectile hole and the light-screen array measurement coordinates is used to build an inversion database for the genetic algorithm during the machine learning process. The simulation and the live firing test show that the optimization method and parameter identification algorithm in this paper can optimize the measurement model and improve the measurement accuracy of the light-screen array principle directly and can also provide a reference for the optimization and parameter identification in other engineering problems.