Effects of short-range disorder upon electronic properties of a-SiC alloys

Molecular dynamics (MD) simulations, based on an empirical potential approach, have provided detailed information about chemical ordering and the structural short-range order in stoichiometric amorphous silicon carbide (a-SiC). Recursion band structure calculations based on amorphous geometries obta...

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Published inApplied surface science Vol. 184; no. 1; pp. 137 - 143
Main Authors Ivashchenko, V.I., Shevchenko, V.I.
Format Journal Article Conference Proceeding
LanguageEnglish
Published Amsterdam Elsevier B.V 12.12.2001
Elsevier Science
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ISSN0169-4332
1873-5584
DOI10.1016/S0169-4332(01)00671-7

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Abstract Molecular dynamics (MD) simulations, based on an empirical potential approach, have provided detailed information about chemical ordering and the structural short-range order in stoichiometric amorphous silicon carbide (a-SiC). Recursion band structure calculations based on amorphous geometries obtained from the MD simulations have enabled to establish the mechanism of an influence of homopolar bonds, three-fold (T 3) and five-fold (T 5) coordinated defects, strongly disordered four-fold coordinated sites and atoms, which are first nearest neighbors (FNN) of these defects (T 4) on the distribution of electronic states. We have found that electronic states at the middle of the gap can be associated with these kinds of defect with the exception of antisite defects (like-atom or homopolar bonding). It is the problem of chemical ordering in the stoichiometric silicon–carbon alloy that is the main subject of the present work. In contrast to crystalline SiC, in a-SiC, the resonance states at the valence band top, associated to Si–Si homonuclear bonds, split for the low symmetry of the amorphous surrounding, which gives rise to the additional split states at the band gap bottom. As a result, in the amorphous material, the decrease of a degree of chemical ordering is accompanied by narrowing the band gap.
AbstractList Molecular dynamics (MD) simulations, based on an empirical potential approach, have provided detailed information about chemical ordering and the structural short-range order in stoichiometric amorphous silicon carbide (a-SiC). Recursion band structure calculations based on amorphous geometries obtained from the MD simulations have enabled to establish the mechanism of an influence of homopolar bonds, three-fold (T 3) and five-fold (T 5) coordinated defects, strongly disordered four-fold coordinated sites and atoms, which are first nearest neighbors (FNN) of these defects (T 4) on the distribution of electronic states. We have found that electronic states at the middle of the gap can be associated with these kinds of defect with the exception of antisite defects (like-atom or homopolar bonding). It is the problem of chemical ordering in the stoichiometric silicon–carbon alloy that is the main subject of the present work. In contrast to crystalline SiC, in a-SiC, the resonance states at the valence band top, associated to Si–Si homonuclear bonds, split for the low symmetry of the amorphous surrounding, which gives rise to the additional split states at the band gap bottom. As a result, in the amorphous material, the decrease of a degree of chemical ordering is accompanied by narrowing the band gap.
Author Shevchenko, V.I.
Ivashchenko, V.I.
Author_xml – sequence: 1
  givenname: V.I.
  surname: Ivashchenko
  fullname: Ivashchenko, V.I.
  email: ivash@stcu551.kiev.ua
– sequence: 2
  givenname: V.I.
  surname: Shevchenko
  fullname: Shevchenko, V.I.
BackLink http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=13386288$$DView record in Pascal Francis
BookMark eNqFkE1LAzEQhoNUsK3-BGEvgh5Wk003yeJBpPhJwUP1HKbJRCPrZklWwX9v2koPXrzMHOZ9ZpJnQkZd6JCQY0bPGWXiYplLU844r04pO6NUSFbKPTJmSvKyrtVsRMa7yAGZpPROKavydEweb5xDM6QiuCK9hTiUEbpXLKxPIVqMxWcfugLbnImh86boY-gxDh43CJRLPy-gbcN3OiT7DtqER799Sl5ub57n9-Xi6e5hfr0oDedyKBslgYM0YECAo41onJpZy5FZWVcWQdZOIRPMCOYMWFg1q0YxLmiV_2Apn5KT7d4ekoHW5Qcbn3Qf_QfEb804V6JSKucutzkTQ0oRnTZ-gMGHbojgW82oXuvTG3167UZTpjf6tMx0_YfeHfiHu9pymBV8eYw6GY-dQetjlqht8P9s-AEgZYnK
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ContentType Journal Article
Conference Proceeding
Copyright 2001 Elsevier Science B.V.
2002 INIST-CNRS
Copyright_xml – notice: 2001 Elsevier Science B.V.
– notice: 2002 INIST-CNRS
DBID AAYXX
CITATION
IQODW
DOI 10.1016/S0169-4332(01)00671-7
DatabaseName CrossRef
Pascal-Francis
DatabaseTitle CrossRef
DatabaseTitleList
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
Physics
EISSN 1873-5584
EndPage 143
ExternalDocumentID 13386288
10_1016_S0169_4332_01_00671_7
S0169433201006717
GrantInformation_xml – fundername: European Materials Research Society
GroupedDBID --K
--M
-~X
.~1
0R~
1B1
1RT
1~.
1~5
23M
4.4
457
4G.
5GY
5VS
6J9
7-5
71M
8P~
9JN
AABNK
AABXZ
AACTN
AAEDT
AAEDW
AAEPC
AAIAV
AAIKJ
AAKOC
AALRI
AAOAW
AAQFI
AAQXK
AARLI
AAXUO
ABFNM
ABFRF
ABJNI
ABMAC
ABNEU
ABXDB
ABXRA
ABYKQ
ACBEA
ACDAQ
ACFVG
ACGFO
ACGFS
ACNNM
ACRLP
ADBBV
ADECG
ADEZE
ADMUD
AEBSH
AEFWE
AEKER
AENEX
AEZYN
AFKWA
AFRZQ
AFTJW
AFZHZ
AGHFR
AGUBO
AGYEJ
AHHHB
AIEXJ
AIKHN
AITUG
AIVDX
AJBFU
AJOXV
AJSZI
ALMA_UNASSIGNED_HOLDINGS
AMFUW
AMRAJ
ASPBG
AVWKF
AXJTR
AZFZN
BBWZM
BKOJK
BLXMC
CS3
EBS
EFJIC
EFLBG
EJD
EO8
EO9
EP2
EP3
F5P
FDB
FEDTE
FGOYB
FIRID
FLBIZ
FNPLU
FYGXN
G-2
G-Q
GBLVA
HMV
HVGLF
HZ~
IHE
J1W
KOM
M24
M38
M41
MAGPM
MO0
N9A
NDZJH
O-L
O9-
OAUVE
OGIMB
OZT
P-8
P-9
P2P
PC.
Q38
R2-
RIG
RNS
ROL
RPZ
SCB
SDF
SDG
SDP
SES
SEW
SMS
SPC
SPCBC
SPD
SPG
SSK
SSM
SSQ
SSZ
T5K
TN5
WH7
WUQ
XFK
XPP
ZMT
~02
~G-
AATTM
AAXKI
AAYWO
AAYXX
ABWVN
ACLOT
ACRPL
ACVFH
ADCNI
ADNMO
AEIPS
AEUPX
AFJKZ
AFPUW
AGQPQ
AIGII
AIIUN
AKBMS
AKRWK
AKYEP
ANKPU
APXCP
CITATION
EFKBS
~HD
BNPGV
IQODW
SSH
ID FETCH-LOGICAL-c337t-987a3a7caca6af0969f84dd3e1d752dea75f8e161c61fcadab9b9813602169d03
IEDL.DBID .~1
ISSN 0169-4332
IngestDate Wed Apr 02 07:26:37 EDT 2025
Wed Oct 01 01:41:48 EDT 2025
Thu Apr 24 22:56:39 EDT 2025
Fri Feb 23 02:21:09 EST 2024
IsPeerReviewed true
IsScholarly true
Issue 1
Keywords Chemical ordering
Gap states
Amorphous silicon carbide
Molecular dynamics simulation
Recursion method
Coordination defects
Pair correlation function
Electronic structure
Inorganic compounds
Tight binding approximation
Molecular dynamics method
Theoretical study
Silicon carbides
Electron distribution
Wide band gap semiconductors
Electronic density of states
Amorphous state structure
Language English
License https://www.elsevier.com/tdm/userlicense/1.0
CC BY 4.0
LinkModel DirectLink
MeetingName Proceedings of the European Materials Research Society 2001-Symposium F Amorphous and Crystalline Silicon Carbide: Material and Applications
MergedId FETCHMERGED-LOGICAL-c337t-987a3a7caca6af0969f84dd3e1d752dea75f8e161c61fcadab9b9813602169d03
PageCount 7
ParticipantIDs pascalfrancis_primary_13386288
crossref_citationtrail_10_1016_S0169_4332_01_00671_7
crossref_primary_10_1016_S0169_4332_01_00671_7
elsevier_sciencedirect_doi_10_1016_S0169_4332_01_00671_7
ProviderPackageCode CITATION
AAYXX
PublicationCentury 2000
PublicationDate 2001-12-12
PublicationDateYYYYMMDD 2001-12-12
PublicationDate_xml – month: 12
  year: 2001
  text: 2001-12-12
  day: 12
PublicationDecade 2000
PublicationPlace Amsterdam
PublicationPlace_xml – name: Amsterdam
PublicationTitle Applied surface science
PublicationYear 2001
Publisher Elsevier B.V
Elsevier Science
Publisher_xml – name: Elsevier B.V
– name: Elsevier Science
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SSID ssj0012873
Score 1.7289485
Snippet Molecular dynamics (MD) simulations, based on an empirical potential approach, have provided detailed information about chemical ordering and the structural...
SourceID pascalfrancis
crossref
elsevier
SourceType Index Database
Enrichment Source
Publisher
StartPage 137
SubjectTerms Amorphous silicon carbide
Chemical ordering
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Coordination defects
Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures
Exact sciences and technology
Gap states
Molecular dynamics simulation
Physics
Recursion method
Surface and interface electron states
Surface states, band structure, electron density of states
Title Effects of short-range disorder upon electronic properties of a-SiC alloys
URI https://dx.doi.org/10.1016/S0169-4332(01)00671-7
Volume 184
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
journalDatabaseRights – providerCode: PRVESC
  databaseName: Elsevier SD Complete Freedom Collection [SCCMFC]
  customDbUrl:
  eissn: 1873-5584
  dateEnd: 99991231
  omitProxy: true
  ssIdentifier: ssj0012873
  issn: 0169-4332
  databaseCode: ACRLP
  dateStart: 19950101
  isFulltext: true
  titleUrlDefault: https://www.sciencedirect.com
  providerName: Elsevier
– providerCode: PRVESC
  databaseName: Elsevier SD Freedom Collection
  customDbUrl:
  eissn: 1873-5584
  dateEnd: 99991231
  omitProxy: true
  ssIdentifier: ssj0012873
  issn: 0169-4332
  databaseCode: .~1
  dateStart: 19950101
  isFulltext: true
  titleUrlDefault: https://www.sciencedirect.com
  providerName: Elsevier
– providerCode: PRVESC
  databaseName: Elsevier SD Freedom Collection Journals [SCFCJ] - NZ
  customDbUrl:
  eissn: 1873-5584
  dateEnd: 99991231
  omitProxy: true
  ssIdentifier: ssj0012873
  issn: 0169-4332
  databaseCode: AIKHN
  dateStart: 19950101
  isFulltext: true
  titleUrlDefault: https://www.sciencedirect.com
  providerName: Elsevier
– providerCode: PRVLSH
  databaseName: Elsevier Journals
  customDbUrl:
  mediaType: online
  eissn: 1873-5584
  dateEnd: 99991231
  omitProxy: true
  ssIdentifier: ssj0012873
  issn: 0169-4332
  databaseCode: AKRWK
  dateStart: 19850101
  isFulltext: true
  providerName: Library Specific Holdings
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV07a8MwEBYhXVpK6ZOmj6ChQzs4sS1bsscQGtKUZkkD2YxkSTRQEhMnQ5f-9t7Zzmsoha7CdzYncfeddfcdIQ8iUJqp1HcCwSBBAczrKK04ZCmuDYyWqSlIfd6GvD8OBpNwUiPddS8MllVWvr_06YW3rlbalTXb2XTaHiGPCLJvQUYBLtfDjnJk_4Iz3frelHmA-y1vmeFh7A7yt108pYZi8dH1ngoljvgtPh1nMger2XLcxU4M6p2Skwo80k75fWekZmbn5GiHUvCCDEo64pzOLc0_AFs7C2wfoLpi2aSrbD6j2-E3NMO_8QukVUUR6YymXYqX8V_5JRn3nt-7faeal-CkjImlE0dCMilSmUouLeQmsY0CrZnxtAh9baQIbWQA4qXcs6nUUsUqjjzGIc7zWLvsitRn85m5JjTwjcLYhegFAJcnUY8NrfIZB8TIGiRYWylJKzJxnGnxmexUjfE4QeMmrpcUxk1Eg7Q2YlnJpvGXQLTegmTvWCTg8f8Sbe5t2faFkJXjkOWb_-u-JYdFLZqHg2HuSH25WJl7ACdL1SxOX5McdF5e-8MfNLHcrg
linkProvider Elsevier
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV1LT8MwDLbGOABCiKd4jhw4wKGsbdqmPU4T0wbbLjCJW5Q0iZiEtmodB_49Ttu9DgiJayQ7lRPZnxv7M8AdC6SiMvWdgFFMUBDzOlLJCLMU1wRaiVQXpD6DYdQdBc_v4XsN2oteGFtWWfn-0qcX3rpaaVbWbGbjcfPV8ohY9i3MKNDlemwLtoMQfXIdtlu9l-5w-ZiASQEtKb4T2yDkrxp5SiXF4r3rPRR6HPZbiNrPRI6GM-XEi7Uw1DmEgwo_klb5iUdQ05Nj2FtjFTyB55KROCdTQ_IPhNfOzHYQEFURbZKvbDohq_k3JLM_5GeWWdWKCOd13Cb2Pf47P4VR5-mt3XWqkQlOSimbO0nMBBUsFamIhMH0JDFxoBTVnmKhr7RgoYk1orw08kwqlJCJTGKPRhjqo0S59Azqk-lEnwMJfC1t-LIABjGXJ6weExrp0whBI72AYGElnlZ84nasxSdfKxyLEm6Ny12PF8bl7AIel2JZSajxl0C8OAK-cTM4Ov2_RBsbR7baEBNzO2f58v-6b2Gn-zbo835v-HIFu0VpmmfnxFxDfT770jeIVeayUd3FH9FM31k
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=proceeding&rft.title=Applied+surface+science&rft.atitle=Effects+of+short-range+disorder+upon+electronic+properties+of+a-SiC+alloys&rft.au=IVASHCHENKO%2C+V.+I&rft.au=SHEVCHENKO%2C+V.+I&rft.date=2001-12-12&rft.pub=Elsevier+Science&rft.issn=0169-4332&rft.volume=184&rft.issue=1-4&rft.spage=137&rft.epage=143&rft_id=info:doi/10.1016%2FS0169-4332%2801%2900671-7&rft.externalDBID=n%2Fa&rft.externalDocID=13386288
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0169-4332&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0169-4332&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0169-4332&client=summon