In-Service Diagnostics for Wire-Bond Lift-off and Solder Fatigue of Power Semiconductor Packages - Eleffendi, Mohd Amir; Johnson, C. Mark (IEEE transactions on power electronics, 2017)
Keywords: Algorithms; Converters; Degradation; Electrical resistance; Estimates; Fatigue; Heat transfer; Insulated Gate Bipolar Transistor (IGBT); Insulated gate bipolar transistors; kalman filtering; Kalman filters; least squares methods; life estimation reliability; Mathematical models; Monitoring; Packages; Parameters; Solders; Temperature measurement; Thermal resistance; Tolerances; Uncertainty; Wire