Design and evaluation of a high throughput robust router for network-on-chip

Network-on-chip (NoC) systems have been proposed to achieve high-performance computing where multiple processors are integrated into one chip. As the number of cores increases and the chips are scaled in the deep submicron technology, the NoC systems become subject to physical manufacture defects an...

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Published inIET computers & digital techniques Vol. 6; no. 3; pp. 173 - 179
Main Authors Alhussien, A., Wang, C., Bagherzadeh, N.
Format Journal Article
LanguageEnglish
Published Stevenage Institution of Engineering and Technology 01.05.2012
John Wiley & Sons, Inc
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ISSN1751-8601
1751-861X
DOI10.1049/iet-cdt.2011.0082

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Abstract Network-on-chip (NoC) systems have been proposed to achieve high-performance computing where multiple processors are integrated into one chip. As the number of cores increases and the chips are scaled in the deep submicron technology, the NoC systems become subject to physical manufacture defects and running-time vulnerability, which result in faults. The faults affect the performance and functionality of the NoC systems and result in communication malfunctions. In this study, a fault tolerant router design with an adaptive routing algorithm that tolerates faults in the network links and the router components is proposed. The approach does not require the use of virtual channels and assures deadlock freedom. Furthermore, the experimental results show that the proposed architecture can tolerate multiple failures and prove robustness and fault tolerance with negligible impact on the performance.
AbstractList Network-on-chip (NoC) systems have been proposed to achieve high-performance computing where multiple processors are integrated into one chip. As the number of cores increases and the chips are scaled in the deep submicron technology, the NoC systems become subject to physical manufacture defects and running-time vulnerability, which result in faults. The faults affect the performance and functionality of the NoC systems and result in communication malfunctions. In this study, a fault tolerant router design with an adaptive routing algorithm that tolerates faults in the network links and the router components is proposed. The approach does not require the use of virtual channels and assures deadlock freedom. Furthermore, the experimental results show that the proposed architecture can tolerate multiple failures and prove robustness and fault tolerance with negligible impact on the performance.
Author Alhussien, A.
Wang, C.
Bagherzadeh, N.
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  surname: Bagherzadeh
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  organization: Department of Electrical Engineering and Computer Engineering, University of California-Irvine, Irvine, California 92697, USA
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Cites_doi 10.1109/TVLSI.2008.2000994
10.1109/DFT.2006.22
10.1109/DSD.2007.4341518
10.1109/DDECS.2010.5491798
10.1016/j.aeue.2010.09.002
10.1007/0-306-48727-6_7
10.1109/DFT.2008.40
10.1109/23.556861
10.1109/CADS.2010.5623552
10.1109/NCA.2010.14
10.1109/VLSIC.2010.5560277
10.1109/IOLTS.2006.33
10.1145/1391469.1391584
10.1109/TCAD.2005.847907
10.1109/NOCS.2008.4492721
10.1109/IPDPS.2001.925002
10.1109/MDT.2007.128
10.1109/NOCS.2010.12
10.1016/j.sysarc.2010.10.009
10.1109/ITNG.2007.5
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Keywords Performance evaluation
Interconnection network
Supercomputing
Processor
Adaptive algorithm
Network architecture
Router
System on a chip
Failures
Deadlock
Fault tolerance
Integrated circuit
Robustness
Miniaturization
Fault tolerant system
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References Rodrigo (10.1049/iet-cdt.2011.0082_r7) 2010
Chaix (10.1049/iet-cdt.2011.0082_r18) 2010
Zhou (10.1049/iet-cdt.2011.0082_r17) 2001
Wang (10.1049/iet-cdt.2011.0082_r27) 2010
Koibuchi (10.1049/iet-cdt.2011.0082_r10) 2008
Pratim Pande (10.1049/iet-cdt.2011.0082_r20) 2006
Park (10.1049/iet-cdt.2011.0082_r12)
Ali (10.1049/iet-cdt.2011.0082_r8) 2007
10.1049/iet-cdt.2011.0082_r15
Zhang (10.1049/iet-cdt.2011.0082_r16) 2008
Gilabert (10.1049/iet-cdt.2011.0082_r1) 2008
Yu (10.1049/iet-cdt.2011.0082_r21) 2008
Eun Lee (10.1049/iet-cdt.2011.0082_r26) 2006
Fick (10.1049/iet-cdt.2011.0082_r11) 2009
Salihundam (10.1049/iet-cdt.2011.0082_r2) 2010
10.1049/iet-cdt.2011.0082_r5
10.1049/iet-cdt.2011.0082_r3
Ho Bahn (10.1049/iet-cdt.2011.0082_r6) 2007
Schonwald (10.1049/iet-cdt.2011.0082_r13) 2007
Grecu (10.1049/iet-cdt.2011.0082_r25) 2006
10.1049/iet-cdt.2011.0082_r9
Pereira Frantz (10.1049/iet-cdt.2011.0082_r4) 2006
10.1049/iet-cdt.2011.0082_r28
10.1049/iet-cdt.2011.0082_r23
10.1049/iet-cdt.2011.0082_r24
10.1049/iet-cdt.2011.0082_r22
Valinataj (10.1049/iet-cdt.2011.0082_r14) 2009
Lehtonen (10.1049/iet-cdt.2011.0082_r19) 2007; 3
References_xml – start-page: 107
  year: 2008
  ident: 10.1049/iet-cdt.2011.0082_r1
  publication-title: Int. Symp. on Networks-on-Chip
– start-page: 82
  year: 2006
  ident: 10.1049/iet-cdt.2011.0082_r26
  publication-title: Proc. Fourth Int. Conf. on Hardware/Software Codesign and System Synthesis, CODES+ISSS '06, ACM
– ident: 10.1049/iet-cdt.2011.0082_r22
  doi: 10.1109/TVLSI.2008.2000994
– start-page: 466
  year: 2006
  ident: 10.1049/iet-cdt.2011.0082_r20
  publication-title: Twenty-first IEEE Int. Symp. on Defect and Fault Tolerance in VLSI Systems
  doi: 10.1109/DFT.2006.22
– year: 2006
  ident: 10.1049/iet-cdt.2011.0082_r25
  publication-title: Proc. 24th IEEE VLSI Test Symp.
– start-page: 527
  year: 2007
  ident: 10.1049/iet-cdt.2011.0082_r13
  publication-title: Tenth Euromicro Conf. on Digital System Design Architectures, Methods and Tools
  doi: 10.1109/DSD.2007.4341518
– volume: 3
  start-page: 1
  year: 2007
  ident: 10.1049/iet-cdt.2011.0082_r19
  publication-title: Proc. Second Int. Conf. on Nano-Networks, Nano-Net’07, ICST, ICST (Institute for Computer Sciences, Social-Informatics and Telecommunications Engineering)
– start-page: 687
  year: 2009
  ident: 10.1049/iet-cdt.2011.0082_r14
  publication-title: Nineth IEEE Conf. on Nanotechnology
– ident: 10.1049/iet-cdt.2011.0082_r15
  doi: 10.1109/DDECS.2010.5491798
– ident: 10.1049/iet-cdt.2011.0082_r9
  doi: 10.1016/j.aeue.2010.09.002
– ident: 10.1049/iet-cdt.2011.0082_r24
  doi: 10.1007/0-306-48727-6_7
– start-page: 352
  year: 2008
  ident: 10.1049/iet-cdt.2011.0082_r21
  publication-title: IEEE Int. Symp. on Defect and Fault Tolerance of VLSI Systems
  doi: 10.1109/DFT.2008.40
– ident: 10.1049/iet-cdt.2011.0082_r3
  doi: 10.1109/23.556861
– start-page: 21
  year: 2009
  ident: 10.1049/iet-cdt.2011.0082_r11
  publication-title: Proc. Conf. on Design, Automation and Test in Europe, DATE '09, European Design and Automation Association, 3001 Leuven
– start-page: 137
  year: 2010
  ident: 10.1049/iet-cdt.2011.0082_r27
  publication-title: Fifteenth CSI Int. Symp. on Computer Architecture and Digital Systems (CADS), 2010
  doi: 10.1109/CADS.2010.5623552
– start-page: 52
  year: 2010
  ident: 10.1049/iet-cdt.2011.0082_r18
  publication-title: Nineth IEEE Int. Symp. on Network Computing and Applications (NCA)
  doi: 10.1109/NCA.2010.14
– start-page: 79
  year: 2010
  ident: 10.1049/iet-cdt.2011.0082_r2
  publication-title: 2010 IEEE Symp. on VLSI Circuits (VLSIC)
  doi: 10.1109/VLSIC.2010.5560277
– start-page: 191
  year: 2006
  ident: 10.1049/iet-cdt.2011.0082_r4
  publication-title: IEEE Int. On-line Testing Symp.
  doi: 10.1109/IOLTS.2006.33
– start-page: 441
  year: 2008
  ident: 10.1049/iet-cdt.2011.0082_r16
  publication-title: Proc. 45th Annual Design Automation Conf., DAC’08, ACM
  doi: 10.1145/1391469.1391584
– start-page: 1033
  year: 2007
  ident: 10.1049/iet-cdt.2011.0082_r6
  publication-title: ITNG ’07: Proc. Int. Conf. on Information Technology, IEEE Computer Society
– ident: 10.1049/iet-cdt.2011.0082_r23
  doi: 10.1109/TCAD.2005.847907
– start-page: 13
  year: 2008
  ident: 10.1049/iet-cdt.2011.0082_r10
  publication-title: Proc. Second ACM/IEEE Int. Symp. on Networks-on-Chip, NOCS '08, IEEE Computer Society
  doi: 10.1109/NOCS.2008.4492721
– start-page: 8
  year: 2001
  ident: 10.1049/iet-cdt.2011.0082_r17
  publication-title: Parallel and Distributed Processing Symp., Proc. 15th Int.
  doi: 10.1109/IPDPS.2001.925002
– ident: 10.1049/iet-cdt.2011.0082_r5
  doi: 10.1109/MDT.2007.128
– start-page: 25
  year: 2010
  ident: 10.1049/iet-cdt.2011.0082_r7
  publication-title: Proc. 2010 Fourth ACM/IEEE Int. Symp. on Networks-on-Chip, NOCS’10, IEEE Computer Society
  doi: 10.1109/NOCS.2010.12
– ident: 10.1049/iet-cdt.2011.0082_r28
  doi: 10.1016/j.sysarc.2010.10.009
– start-page: 1027
  year: 2007
  ident: 10.1049/iet-cdt.2011.0082_r8
  publication-title: Fourth Int. Conf. on Information Technology
  doi: 10.1109/ITNG.2007.5
– start-page: 93
  ident: 10.1049/iet-cdt.2011.0082_r12
  publication-title: Int. Conf. on Dependable Systems and Networks 2006
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Snippet Network-on-chip (NoC) systems have been proposed to achieve high-performance computing where multiple processors are integrated into one chip. As the number of...
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StartPage 173
SubjectTerms Algorithms
Applied sciences
Channels
Chips
Design engineering
Design. Technologies. Operation analysis. Testing
Electronics
Exact sciences and technology
Failure
Fault tolerance
Faults
Hardware
Input-output equipment
Integrated circuits
Integrated circuits by function (including memories and processors)
Routers
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Testing, measurement, noise and reliability
Title Design and evaluation of a high throughput robust router for network-on-chip
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