Neural-network–based algorithm for the inverse problem of measuring K-shell ionization cross-sections of Si induced by 3–25 keV electrons and 4.5–9 keV positrons using the thick-target method - Li, Y. D.; Wu, Y.; Huang, C. J.; Liu, Z. H.; Pan, M. (Europhysics letters, 2023)
Keywords: Accuracy; Algorithms; Born approximation; Characteristic X rays; Electrons; Error analysis; Ill posed problems; Inverse problems; Ionization cross sections; Monte Carlo simulation; Neural networks; Positrons; Regularization; Regularization methods; Silicon