APA (7th ed.) Citation

Li, Y. D., Wu, Y., Huang, C. J., Liu, Z. H., & Pan, M. (2023). Neural-network–based algorithm for the inverse problem of measuring K-shell ionization cross-sections of Si induced by 3–25 keV electrons and 4.5–9 keV positrons using the thick-target method. Europhysics letters, 143(6), 65003-65009. https://doi.org/10.1209/0295-5075/acf60b

Chicago Style (17th ed.) Citation

Li, Y. D., Y. Wu, C. J. Huang, Z. H. Liu, and M. Pan. "Neural-network–based Algorithm for the Inverse Problem of Measuring K-shell Ionization Cross-sections of Si Induced by 3–25 KeV Electrons and 4.5–9 KeV Positrons Using the Thick-target Method." Europhysics Letters 143, no. 6 (2023): 65003-65009. https://doi.org/10.1209/0295-5075/acf60b.

MLA (9th ed.) Citation

Li, Y. D., et al. "Neural-network–based Algorithm for the Inverse Problem of Measuring K-shell Ionization Cross-sections of Si Induced by 3–25 KeV Electrons and 4.5–9 KeV Positrons Using the Thick-target Method." Europhysics Letters, vol. 143, no. 6, 2023, pp. 65003-65009, https://doi.org/10.1209/0295-5075/acf60b.