Switch-level testability of the dynamic CMOS PLA - Cockburn, B.F.; Brzozowski, J.A. (Integration (Amsterdam), 1990)
Keywords: Applied sciences; CMOS PLA; Electronics; Exact sciences and technology; fault modelling; Integrated circuits; Integrated circuits by function (including memories and processors); Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices; Switch-level testability; testable PLA; Switch-level testability; testable PLA; fault modelling; CMOS PLA; VLSI circuit; Circuit design; Complementary MOS technology; Test; Integrated circuit; Programmable logic array; Boolean function; Reliability; Implementation; Defect detection