APA (7th ed.) Citation

Cockburn, B., & Brzozowski, J. (1990). Switch-level testability of the dynamic CMOS PLA. Integration (Amsterdam), 9(1), 49-80. https://doi.org/10.1016/0167-9260(90)90005-L

Chicago Style (17th ed.) Citation

Cockburn, B.F, and J.A Brzozowski. "Switch-level Testability of the Dynamic CMOS PLA." Integration (Amsterdam) 9, no. 1 (1990): 49-80. https://doi.org/10.1016/0167-9260(90)90005-L.

MLA (9th ed.) Citation

Cockburn, B.F, and J.A Brzozowski. "Switch-level Testability of the Dynamic CMOS PLA." Integration (Amsterdam), vol. 9, no. 1, 1990, pp. 49-80, https://doi.org/10.1016/0167-9260(90)90005-L.