A comparison among the results of various dispersion relations for the ellipsometric data of Mn:ZnO thin films using PSO algorithm

Using particle swarm optimization (PSO) algorithm, the Cauchy, Forouhi-Bloomer (FB) and Sellmeier parametrization models were compared for the Mn doped ZnO (Mn:ZnO) thin films. The variation of both refractive and extinction coefficients with Mn concentration was also discussed. Our calculations dem...

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Published inPhysica. B, Condensed matter Vol. 545; pp. 125 - 133
Main Authors Faraji, M., Esmaeili, A., Shirzad, A.
Format Journal Article
LanguageEnglish
Published Amsterdam Elsevier B.V 15.09.2018
Elsevier BV
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ISSN0921-4526
1873-2135
DOI10.1016/j.physb.2018.05.021

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Abstract Using particle swarm optimization (PSO) algorithm, the Cauchy, Forouhi-Bloomer (FB) and Sellmeier parametrization models were compared for the Mn doped ZnO (Mn:ZnO) thin films. The variation of both refractive and extinction coefficients with Mn concentration was also discussed. Our calculations demonstrate that despite the Sellmeier model exhibits the best fit with the lowest root-mean-square error (RMSE) in the transparent region, the FB model is well-suited in the both transparent and absorbing areas. Different energy gaps, roughnesses and thicknesses were obtained by the mentioned models. A comparison with the results of Tauck-Loretz model along with an exciton-based dielectric function were also done for our results. •Introducing a PSO algorithm to model ellipsometric data which is easy to use.•Making a comparison among different dispersion models.•Finding Mn effect on the refractive index and extinction coefficient of ZnO thin film.
AbstractList Using particle swarm optimization (PSO) algorithm, the Cauchy, Forouhi-Bloomer (FB) and Sellmeier parametrization models were compared for the Mn doped ZnO (Mn:ZnO) thin films. The variation of both refractive and extinction coefficients with Mn concentration was also discussed. Our calculations demonstrate that despite the Sellmeier model exhibits the best fit with the lowest root-mean-square error (RMSE) in the transparent region, the FB model is well-suited in the both transparent and absorbing areas. Different energy gaps, roughnesses and thicknesses were obtained by the mentioned models. A comparison with the results of Tauck-Loretz model along with an exciton-based dielectric function were also done for our results.
Using particle swarm optimization (PSO) algorithm, the Cauchy, Forouhi-Bloomer (FB) and Sellmeier parametrization models were compared for the Mn doped ZnO (Mn:ZnO) thin films. The variation of both refractive and extinction coefficients with Mn concentration was also discussed. Our calculations demonstrate that despite the Sellmeier model exhibits the best fit with the lowest root-mean-square error (RMSE) in the transparent region, the FB model is well-suited in the both transparent and absorbing areas. Different energy gaps, roughnesses and thicknesses were obtained by the mentioned models. A comparison with the results of Tauck-Loretz model along with an exciton-based dielectric function were also done for our results. •Introducing a PSO algorithm to model ellipsometric data which is easy to use.•Making a comparison among different dispersion models.•Finding Mn effect on the refractive index and extinction coefficient of ZnO thin film.
Author Esmaeili, A.
Faraji, M.
Shirzad, A.
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ZnO
Sellmeier
PSO algorithm
Ellipsometry
Cauchy
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  ident: 10.1016/j.physb.2018.05.021_bib11
  publication-title: Phys. Rev. Lett.
  doi: 10.1103/PhysRevLett.75.4090
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Snippet Using particle swarm optimization (PSO) algorithm, the Cauchy, Forouhi-Bloomer (FB) and Sellmeier parametrization models were compared for the Mn doped ZnO...
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SubjectTerms Algorithms
Cauchy
Coefficient of variation
Dispersion
Ellipsometry
Energy gap
Forouhi-Bloomer
Optical properties
Optimization algorithms
Parameterization
Particle swarm optimization
PSO algorithm
Root-mean-square errors
Sellmeier
Thin films
Zinc oxide
Zinc oxides
ZnO
Title A comparison among the results of various dispersion relations for the ellipsometric data of Mn:ZnO thin films using PSO algorithm
URI https://dx.doi.org/10.1016/j.physb.2018.05.021
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Volume 545
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