Timing-Skew Calibration Techniques in Time-Interleaved ADCs
Time-interleaved (TI) analog-to-digital converters (ADCs) are a widely used architecture in high-speed ADCs. With the growing demand for higher sampling rates, time interleaving plays an increasingly important role. However, imperfections introduced by time interleaving, particularly timing skew, si...
Saved in:
| Published in | IEEE open journal of solid-state circuits Vol. 5; pp. 1 - 10 |
|---|---|
| Main Authors | , , , , |
| Format | Journal Article |
| Language | English |
| Published |
IEEE
2025
|
| Subjects | |
| Online Access | Get full text |
| ISSN | 2644-1349 2644-1349 |
| DOI | 10.1109/OJSSCS.2024.3519486 |
Cover
| Abstract | Time-interleaved (TI) analog-to-digital converters (ADCs) are a widely used architecture in high-speed ADCs. With the growing demand for higher sampling rates, time interleaving plays an increasingly important role. However, imperfections introduced by time interleaving, particularly timing skew, significantly limit the ADC performance. This article presents a comprehensive review of timing skew and its calibration techniques in TI ADCs. It covers the fundamentals of time interleaving, the principle of timing skew, and general considerations of timing-skew calibration. Moreover, it categorizes existing calibration techniques into three types: 1) autocorrelation-based; 2) reference-channel-based; and 3) reference-signal-based, and provides detailed analyses. |
|---|---|
| AbstractList | Time-interleaved (TI) analog-to-digital converters (ADCs) are a widely used architecture in high-speed ADCs. With the growing demand for higher sampling rates, time interleaving plays an increasingly important role. However, imperfections introduced by time interleaving, particularly timing skew, significantly limit the ADC performance. This article presents a comprehensive review of timing skew and its calibration techniques in TI ADCs. It covers the fundamentals of time interleaving, the principle of timing skew, and general considerations of timing-skew calibration. Moreover, it categorizes existing calibration techniques into three types: 1) autocorrelation-based; 2) reference-channel-based; and 3) reference-signal-based, and provides detailed analyses. |
| Author | Sun, Nan Gu, Mingyang Tao, Yunsong Jie, Lu Zhong, Yi |
| Author_xml | – sequence: 1 givenname: Mingyang orcidid: 0009-0005-5618-3074 surname: Gu fullname: Gu, Mingyang organization: Department of Electronic Engineering, Tsinghua University, Beijing, China – sequence: 2 givenname: Yunsong orcidid: 0000-0002-5469-9895 surname: Tao fullname: Tao, Yunsong organization: Department of Electronic Engineering, Tsinghua University, Beijing, China – sequence: 3 givenname: Yi surname: Zhong fullname: Zhong, Yi organization: Department of Electronic Engineering, Tsinghua University, Beijing, China – sequence: 4 givenname: Lu surname: Jie fullname: Jie, Lu organization: School of Integrated Circuits, Tsinghua University, Beijing, China – sequence: 5 givenname: Nan orcidid: 0000-0002-5536-8385 surname: Sun fullname: Sun, Nan email: nansun@tsinghua.edu.cn organization: Department of Electronic Engineering, Tsinghua University, Beijing, China |
| BookMark | eNplkctOwzAQRS1UJF79Alj0B1I8HjuJxQqFV1GlLlrWluNMwCVNShyo-HtaUiEEq3lI50hz54QN6qYmxs6BjwG4vpw9zufZfCy4kGNUoGUaH7BjEUsZAUo9-NUfsWEIS865UACAeMyuFn7l6-do_kqbUWYrn7e28009WpB7qf3bO4WR305-RdGk7qityH5QMbq-ycIZOyxtFWi4r6fs6e52kT1E09n9JLueRg4RukjYOHdklRKuECCt1mmSl7my6ASqhMd5QUKnkCik2BUqRqUQXAm7WyAReMomvbdo7NKsW7-y7adprDffi6Z9NrbtvKvIYKJBFrlwqdIyB0pzTF0qdJxokThpty7Zu97rtf3c2Kr6EQI3uzxNswzBBbPL0-zz3GLYY65tQmip_Ef1X_hLXfSUJ6JfRMplLBC_ANHAgfY |
| CODEN | IOJSBG |
| Cites_doi | 10.1109/JSSC.2014.2364043 10.1109/JSSC.2017.2747758 10.23919/VLSIC.2017.8008507 10.1109/JSSC.2011.2164961 10.1109/A-SSCC60305.2024.10849123 10.1109/jssc.2024.3437168 10.1109/JSSC.2013.2239005 10.1109/VLSITechnologyandCir46769.2022.9830208 10.1109/JSSC.2011.2108125 10.1109/JSSC.2013.2258814 10.1109/JSSC.1980.1051512 10.1109/JSSC.2002.804327 10.1109/JSSC.2017.2732732 10.1109/JSSC.1987.1052844 10.1109/jssc.2024.3421363 10.1109/JSSC.2018.2793535 10.1109/JSSC.2011.2109511 10.1109/JSSC.2020.3023882 10.1109/JSSC.2014.2313571 10.1109/ISSCC42615.2023.10067573 10.1109/ISSCC.2013.6487817 10.1109/JSSC.2021.3073976 10.1109/JSSC.2019.2915583 10.1109/ISSCC.2014.6757481 10.23919/VLSIC.2019.8778077 10.1109/TCSI.2004.838434 10.1109/VLSITechnologyandCir46769.2022.9830416 10.1109/JSSC.2018.2843360 10.1109/JSSC.2017.2713523 10.1109/ISSCC.2007.373495 10.1109/JSSC.2019.2945298 10.1109/ISSCC.2015.7063127 10.1109/JSSC.2024.3482567 10.23919/VLSICircuits52068.2021.9492436 10.1109/JSSC.2014.2362851 10.1109/CICC60959.2024.10528960 10.1109/ISSCC49657.2024.10454299 10.1109/jssc.2024.3514870 |
| ContentType | Journal Article |
| DBID | 97E ESBDL RIA RIE AAYXX CITATION ADTOC UNPAY DOA |
| DOI | 10.1109/OJSSCS.2024.3519486 |
| DatabaseName | IEEE All-Society Periodicals Package (ASPP) 2005–Present IEEE Xplore Open Access Journals IEEE All-Society Periodicals Package (ASPP) 1998–Present IEEE Electronic Library (IEL) CrossRef Unpaywall for CDI: Periodical Content Unpaywall DOAJ Directory of Open Access Journals |
| DatabaseTitle | CrossRef |
| DatabaseTitleList | |
| Database_xml | – sequence: 1 dbid: DOA name: DOAJ Directory of Open Access Journals url: https://www.doaj.org/ sourceTypes: Open Website – sequence: 2 dbid: RIE name: IEEE Electronic Library (IEL) url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/ sourceTypes: Publisher – sequence: 3 dbid: UNPAY name: Unpaywall url: https://proxy.k.utb.cz/login?url=https://unpaywall.org/ sourceTypes: Open Access Repository |
| DeliveryMethod | fulltext_linktorsrc |
| Discipline | Engineering |
| EISSN | 2644-1349 |
| EndPage | 10 |
| ExternalDocumentID | oai_doaj_org_article_37914db2c8594b1e8b38c82967927c4a 10.1109/ojsscs.2024.3519486 10_1109_OJSSCS_2024_3519486 10804623 |
| Genre | orig-research |
| GrantInformation_xml | – fundername: National Key Research and Development Program of China grantid: 2019YFB2205003 – fundername: NSFC grantid: 62090042; 62374098; 62434005 – fundername: Beijing National Research Center for Information Science and Technology – fundername: Beijing Innovation Center for Future Chip |
| GroupedDBID | 0R~ 97E AAJGR ABAZT ABVLG ALMA_UNASSIGNED_HOLDINGS BEFXN BFFAM BGNUA BKEBE BPEOZ EBS ESBDL GROUPED_DOAJ JAVBF M~E OCL OK1 RIA RIE AAYXX CITATION ADTOC UNPAY |
| ID | FETCH-LOGICAL-c331t-2a6bcea552cd214a9987bfb5a3c235706bde2981753e6cd5635531cf151941723 |
| IEDL.DBID | UNPAY |
| ISSN | 2644-1349 |
| IngestDate | Fri Oct 03 12:50:34 EDT 2025 Sun Sep 07 11:20:47 EDT 2025 Tue Jul 01 03:50:41 EDT 2025 Wed Aug 27 01:53:09 EDT 2025 |
| IsDoiOpenAccess | true |
| IsOpenAccess | true |
| IsPeerReviewed | true |
| IsScholarly | true |
| Language | English |
| License | https://creativecommons.org/licenses/by/4.0/legalcode cc-by |
| LinkModel | DirectLink |
| MergedId | FETCHMERGED-LOGICAL-c331t-2a6bcea552cd214a9987bfb5a3c235706bde2981753e6cd5635531cf151941723 |
| ORCID | 0000-0002-5469-9895 0009-0005-5618-3074 0000-0002-5536-8385 |
| OpenAccessLink | https://proxy.k.utb.cz/login?url=https://doi.org/10.1109/ojsscs.2024.3519486 |
| PageCount | 10 |
| ParticipantIDs | unpaywall_primary_10_1109_ojsscs_2024_3519486 crossref_primary_10_1109_OJSSCS_2024_3519486 ieee_primary_10804623 doaj_primary_oai_doaj_org_article_37914db2c8594b1e8b38c82967927c4a |
| ProviderPackageCode | CITATION AAYXX |
| PublicationCentury | 2000 |
| PublicationDate | 20250000 2025-00-00 2025-01-01 |
| PublicationDateYYYYMMDD | 2025-01-01 |
| PublicationDate_xml | – year: 2025 text: 20250000 |
| PublicationDecade | 2020 |
| PublicationTitle | IEEE open journal of solid-state circuits |
| PublicationTitleAbbrev | OJSSCS |
| PublicationYear | 2025 |
| Publisher | IEEE |
| Publisher_xml | – name: IEEE |
| References | ref13 ref35 ref12 ref34 ref15 ref37 ref14 ref36 ref31 ref30 ref11 ref33 ref10 ref32 ref2 ref17 ref39 ref16 ref38 ref19 ref18 ref24 ref23 ref26 ref25 ref20 ref22 ref21 ref28 ref27 ref29 ref8 ref7 ref9 ref4 ref3 ref6 ref5 Murmann (ref1) 2024 |
| References_xml | – ident: ref30 doi: 10.1109/JSSC.2014.2364043 – ident: ref38 doi: 10.1109/JSSC.2017.2747758 – ident: ref34 doi: 10.23919/VLSIC.2017.8008507 – ident: ref37 doi: 10.1109/JSSC.2011.2164961 – ident: ref9 doi: 10.1109/A-SSCC60305.2024.10849123 – ident: ref19 doi: 10.1109/jssc.2024.3437168 – ident: ref20 doi: 10.1109/JSSC.2013.2239005 – ident: ref18 doi: 10.1109/VLSITechnologyandCir46769.2022.9830208 – ident: ref23 doi: 10.1109/JSSC.2011.2108125 – ident: ref11 doi: 10.1109/JSSC.2013.2258814 – ident: ref2 doi: 10.1109/JSSC.1980.1051512 – ident: ref13 doi: 10.1109/JSSC.2002.804327 – ident: ref28 doi: 10.1109/JSSC.2017.2732732 – ident: ref3 doi: 10.1109/JSSC.1987.1052844 – ident: ref8 doi: 10.1109/jssc.2024.3421363 – ident: ref15 doi: 10.1109/JSSC.2018.2793535 – ident: ref31 doi: 10.1109/JSSC.2011.2109511 – ident: ref6 doi: 10.1109/JSSC.2020.3023882 – ident: ref12 doi: 10.1109/JSSC.2014.2313571 – ident: ref33 doi: 10.1109/ISSCC42615.2023.10067573 – ident: ref5 doi: 10.1109/ISSCC.2013.6487817 – ident: ref26 doi: 10.1109/JSSC.2021.3073976 – ident: ref22 doi: 10.1109/JSSC.2019.2915583 – ident: ref14 doi: 10.1109/ISSCC.2014.6757481 – ident: ref16 doi: 10.23919/VLSIC.2019.8778077 – ident: ref39 doi: 10.1109/TCSI.2004.838434 – ident: ref17 doi: 10.1109/VLSITechnologyandCir46769.2022.9830416 – ident: ref21 doi: 10.1109/JSSC.2018.2843360 – ident: ref25 doi: 10.1109/JSSC.2017.2713523 – ident: ref4 doi: 10.1109/ISSCC.2007.373495 – ident: ref27 doi: 10.1109/JSSC.2019.2945298 – ident: ref29 doi: 10.1109/ISSCC.2015.7063127 – ident: ref35 doi: 10.1109/JSSC.2024.3482567 – ident: ref32 doi: 10.23919/VLSICircuits52068.2021.9492436 – volume-title: ADC performance survey 1997-2024 year: 2024 ident: ref1 – ident: ref24 doi: 10.1109/JSSC.2014.2362851 – ident: ref36 doi: 10.1109/CICC60959.2024.10528960 – ident: ref10 doi: 10.1109/ISSCC49657.2024.10454299 – ident: ref7 doi: 10.1109/jssc.2024.3514870 |
| SSID | ssj0002511133 |
| Score | 2.2949772 |
| Snippet | Time-interleaved (TI) analog-to-digital converters (ADCs) are a widely used architecture in high-speed ADCs. With the growing demand for higher sampling rates,... |
| SourceID | doaj unpaywall crossref ieee |
| SourceType | Open Website Open Access Repository Index Database Publisher |
| StartPage | 1 |
| SubjectTerms | Accuracy Analog-to-digital converter (ADC) Bandwidth Calibration Clocks Delay lines Jitter Threshold voltage Time-domain analysis time-interleaved (TI) ADC Timing timing skew timing-skew calibration |
| SummonAdditionalLinks | – databaseName: DOAJ Directory of Open Access Journals dbid: DOA link: http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwrV1NS8NAEF3Ei3oQPyrWL3LwaDT7kWQXT1oVEdRDW_AWdicTUWsV01r89-4kUSIevHhMCGTyJmTfWzLvMbaPUADGuZclXv54gZKb0OssF_IUyQ4cEFIaTr6-SS6H6uouvmtFfdE_YbU9cA3ckUwNV7kToGOjHEftpAYtTJIakYKqqFGkTUtM0TeYiLNXX43NEI_M0e1Vv9_re0Eo1CGF0imanm4tRZVjfxOxssQWpuNX-zGzo1FrtblYYcsNTQxO6vJW2RyO19hSyzxwnR0PKJDrPuw_4SygEStXNzMYfNmylsGDP3p4xrDa9xuhfcc8ODnrlR02vDgf9C7DJgohBCn5JBQ2cYA2jgXkgivrRVLqChdbCeRXEyUuR2E02W5iAnlMNEJyKDg9qecocoPNj1_GuMkCbrVIBZqiUFwVyrhcAkQ6tTYBJ1F12cEXKtlr7XiRVUohMlkNYkYgZg2IXXZKyH1fSnbV1QnfxKxpYvZXE7usQ7i37qdpaFZ2WfjdiF_FvDyWJZQ_itn6j2K22aKgkN9qn2WHzU_eprjrmcfE7VUv2SfX-dBB priority: 102 providerName: Directory of Open Access Journals – databaseName: IEEE Electronic Library (IEL) dbid: RIE link: http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1Lb9NAEB7RXqAHnkWkPOQDR5xmH_Z6xakEqqoS5ZBU6s3anR2jtiGpcNIKfj07aycKICRutmXZo5mxZr7xzDcAbwkbpCJEWBLhTwQoweYRZ_lcGGI6cCQ0PJz8-aw8OdenF8VFP6yeZmGIKDWf0ZAP07_8sMAVl8oOuR9Ox3i9AzumKrthrU1BhXPlCLh6ZiExsodfTieT8SRiQKmHvIdO88D0VvRJJP39VpU9uL-a37gfd2422wowx4_gbC1a11dyPVwt_RB__sHa-N-yP4aHfaqZHXW-8QTu0fwp7G0RED6D91Ne6vU1n1zTXcZjWr5ziGy6pnZts8t4dvmN8lQ7nJG7pZAdfRy3-3B-_Gk6Psn7dQo5KiWWuXSlR3JFITFIoV0EWsY3vnAKmfNmVPpA0lZM3UklhoJTESWwEay6mOeo57A7X8zpBWTCVdJIsk2jhW609UEhjirjXIlekR7Au7Wa65uONaNOaGNk684qNVul7q0ygA9sis2tTHmdLkQN1v0XVCtjhQ5eYlVY7QVVXlVYSVsaKw1qN4B91vrW-zqFDyDfWPYvYRZXbYvtb8Ic_OM5L-GB5N2_qfzyCnaX31f0OiYkS_8mOeIvPxbbEA priority: 102 providerName: IEEE |
| Title | Timing-Skew Calibration Techniques in Time-Interleaved ADCs |
| URI | https://ieeexplore.ieee.org/document/10804623 https://doi.org/10.1109/ojsscs.2024.3519486 https://doaj.org/article/37914db2c8594b1e8b38c82967927c4a |
| UnpaywallVersion | publishedVersion |
| Volume | 5 |
| hasFullText | 1 |
| inHoldings | 1 |
| isFullTextHit | |
| isPrint | |
| journalDatabaseRights | – providerCode: PRVAON databaseName: DOAJ Directory of Open Access Journals customDbUrl: eissn: 2644-1349 dateEnd: 99991231 omitProxy: true ssIdentifier: ssj0002511133 issn: 2644-1349 databaseCode: DOA dateStart: 20210101 isFulltext: true titleUrlDefault: https://www.doaj.org/ providerName: Directory of Open Access Journals – providerCode: PRVHPJ databaseName: ROAD: Directory of Open Access Scholarly Resources customDbUrl: eissn: 2644-1349 dateEnd: 99991231 omitProxy: true ssIdentifier: ssj0002511133 issn: 2644-1349 databaseCode: M~E dateStart: 20210101 isFulltext: true titleUrlDefault: https://road.issn.org providerName: ISSN International Centre |
| link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlZ1Nb9NAEIZHkB5QD3wWkQoiHziyIfthe1ecQmhVVWpBSiKVk7U7HqO2Ia1w0goO_HZ2bLdKQUhwsWRrLY9m1tp5vZ5nAF4TVkhpGWVJlD9RoJRORJ0VhMyJceBImHNx8tFxdjA3hyfpScfZ5lqYzf17OXJvL87qGhmrrcyQe8kZm92HrSyNiXcPtubHn8afuX1cXNUFg_Y6rtBf7ryz9jSI_q6nyjY8WC8v_fdrv1hsLC_7j9q67bqhEvJfJefD9SoM8cdvzMZ_tPwxPOzSzGTczosncI-WT2F7Az74DN7NuKHXFzE9p-uES7RCOxmS2Q3WtU5O49npVxLNd8MF-Ssqk_GHSb0D8_292eRAdK0UBGotV0L5LCD5NFVYKml8FFl5qELqNTLvZpSFkpSzjO2kDMuU0xAtsZJseMxx9HPoLS-W9AIS6a3KFbmqMtJUxoVSI45s7n2GQZPpw5sbJxeXLTGjaJTGyBUfD6fTybRgnxSdT_rwngNxO5Rx182F6Muie3sKnTtpyqDQps4ESTZoi1a5LHcqR-P7sMNh3Hie5aJb3QdxG9c_jGkDdMeY3f8c_xJ6q29rehXzklUYNHo-Ho9-7g2aQsJBN0N_Aeov3x8 |
| linkProvider | Unpaywall |
| linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1Lb9NAEB5BOZQeeBYRnj5wxGn24ceKUwlUobThkFTqzdqdHaPSkFQ4oYJfz87aiQIIiZttWfZoZqyZbzzzDcArwhop8wGWBPgTAIo3acBZLhUFMR04EhY8nHw6zkdn-vg8O--G1eMsDBHF5jPq82H8l-8XuOJS2QH3w-kQr2_CrUxrnbXjWpuSCmfLAXJ13EJiYA4-HU8mw0lAgVL3eROd5pHprfgTafq7vSp7sLuaX9kf13Y22woxR3dhvBau7Sy57K-Wro8__-Bt_G_p78GdLtlMDlvvuA83aP4A9rYoCB_Cmymv9fqcTi7pOuFBLde6RDJdk7s2yUU4u_hKaawezsh-J58cvhs2-3B29H46HKXdQoUUlRLLVNrcIdksk-il0DZArcLVLrMKmfVmkDtP0pRM3kk5-oyTESWwFqy6kOmoR7AzX8zpMSTClrKQZOpaC11r47xCHJSFtTk6RboHr9dqrq5a3owq4o2BqVqrVGyVqrNKD96yKTa3Mul1vBA0WHXfUKUKI7R3EsvMaCeodKrEUpq8MLJAbXuwz1rfel-r8B6kG8v-JcziS9Ng85swT_7xnJewO5qenlQnH8Yfn8JtyZuAYzHmGewsv63oeUhPlu5FdMpf4iPeXQ |
| linkToUnpaywall | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlZ3fa9RAEMeHen2QPqjVSk9U8tDH7nn7I8kuPp2npRTaCncH9SnsTibS9not5s6if707SVquiqCPCRsyzEzY-SaZzwDsEVZIaRllSZQ_UaCUTkSdFYTMiXHgSJhzc_LxSXY4M0dn6VnH2eZemPXv93Lo3l1f1DUyVluZAc-SMzZ7BJtZGgvvHmzOTj6PvvD4uLirCwbtdVyhv1z5YO9pEP3dTJUteLxa3Pgft34-X9teDp62fdt1QyXkv0ouB6tlGODP35iN_2j5M3jSlZnJqM2LbdigxXPYWoMPvoD3Ux7o9VVMLuk24Rat0CZDMr3DutbJeTw6vyLRvDeck_9OZTL6OK53YHbwaTo-FN0oBYFay6VQPgtIPk0VlkoaH0VWHqqQeo3MuxlmoSTlLGM7KcMy5TJES6wkGx5rHP0SeovrBe1CIr1VuSJXVUaayrhQasShzb3PMGgyfdi_c3Jx0xIzikZpDF1xejSZjCcF-6TofNKHDxyI-6WMu25ORF8W3dNT6NxJUwaFNnUmSLJBW7TKZblTORrfhx0O49r9LDfd6j6I-7j-YUwboAfGvPrP9a-ht_y2ojexLlmGt10-_gJchNv4 |
| openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Timing-Skew+Calibration+Techniques+in+Time-Interleaved+ADCs&rft.jtitle=IEEE+open+journal+of+solid-state+circuits&rft.au=Gu%2C+Mingyang&rft.au=Tao%2C+Yunsong&rft.au=Zhong%2C+Yi&rft.au=Jie%2C+Lu&rft.date=2025&rft.issn=2644-1349&rft.eissn=2644-1349&rft.volume=5&rft.spage=1&rft.epage=10&rft_id=info:doi/10.1109%2FOJSSCS.2024.3519486&rft.externalDBID=n%2Fa&rft.externalDocID=10_1109_OJSSCS_2024_3519486 |
| thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=2644-1349&client=summon |
| thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=2644-1349&client=summon |
| thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=2644-1349&client=summon |