A Cost Analysis of Systems Subject to Random Field Environments and Reliability

We present a generalized cost model subject to random field environments with considerations of cost to remove failures during testing and warranty periods, and penalty cost due to the system failures. We also determine the optimal release time policies that minimize the expected system cost. Many s...

Full description

Saved in:
Bibliographic Details
Published inIEEE transactions on systems, man and cybernetics. Part C, Applications and reviews Vol. 40; no. 4; pp. 429 - 437
Main Authors Sgarbossa, Fabio, Hoang Pham
Format Journal Article
LanguageEnglish
Published IEEE 01.07.2010
Subjects
Online AccessGet full text
ISSN1094-6977
1558-2442
DOI10.1109/TSMCC.2010.2042713

Cover

Abstract We present a generalized cost model subject to random field environments with considerations of cost to remove failures during testing and warranty periods, and penalty cost due to the system failures. We also determine the optimal release time policies that minimize the expected system cost. Many scientific contributions have been developed in software reliability modeling, while none has studied the manufacturing or industrial system reliability growth yet, considering also the differences between testing and operating environments. The application of the proposed model, in comparison to the nonhomogenous Poisson process Goel-Okumoto model, to an industrial application is discussed to illustrate how the proposed model can be used in practice.
AbstractList We present a generalized cost model subject to random field environments with considerations of cost to remove failures during testing and warranty periods, and penalty cost due to the system failures. We also determine the optimal release time policies that minimize the expected system cost. Many scientific contributions have been developed in software reliability modeling, while none has studied the manufacturing or industrial system reliability growth yet, considering also the differences between testing and operating environments. The application of the proposed model, in comparison to the nonhomogenous Poisson process Goel-Okumoto model, to an industrial application is discussed to illustrate how the proposed model can be used in practice.
Author Sgarbossa, Fabio
Hoang Pham
Author_xml – sequence: 1
  givenname: Fabio
  surname: Sgarbossa
  fullname: Sgarbossa, Fabio
  email: fabio.sgarbossa@unipd.it
  organization: Dept. of Manage. & Ind. Syst., Univ. of Padova, Padova, Italy
– sequence: 2
  surname: Hoang Pham
  fullname: Hoang Pham
  email: hopham@rci.rutgers.edu
  organization: Dept. of Ind. & Syst. Eng., Rutgers Univ., Piscataway, NJ, USA
BookMark eNp9kD1PwzAQhi0EEm3hD8DijSnFX4njsYpaQCqq1JY5cuKL5CqxS-wi9d-T0oqBgVvuTvc-NzxjdO28A4QeKJlSStTzdvNeFFNGhp0RwSTlV2hE0zRPmBDsepiJEkmmpLxF4xB2hFAhFB-h1QwXPkQ8c7o9Bhuwb_DmGCJ0AW8O1Q7qiKPHa-2M7_DCQmvw3H3Z3rsOXAx4OOA1tFZXtrXxeIduGt0GuL_0CfpYzLfFa7JcvbwVs2VScyZjAinnlckzqSA3qmqaNDUVEVoMpUzeVCLTdaoamRFFDWdKA-eZ4kYwYUyt-AQ9nf_ue_95gBDLzoYa2lY78IdQypRnMs9JPiTzc7LufQg9NGVto47Wu9hr25aUlCeF5Y_C8qSwvCgcUPYH3fe20_3xf-jxDFkA-AVSwSVTin8D-hF-xA
CODEN ITCRFH
CitedBy_id crossref_primary_10_1007_s00180_023_01430_9
crossref_primary_10_1007_s40595_016_0065_1
crossref_primary_10_3390_app142110072
crossref_primary_10_1007_s13198_023_01859_7
crossref_primary_10_1007_s12204_015_1657_0
crossref_primary_10_1007_s13198_011_0055_8
crossref_primary_10_1007_s40595_013_0003_4
crossref_primary_10_3390_app8050714
crossref_primary_10_1017_S0269964820000352
crossref_primary_10_1080_02331934_2013_854787
crossref_primary_10_1142_S0218539313400019
crossref_primary_10_1002_mma_7445
crossref_primary_10_1016_j_strusafe_2020_101999
crossref_primary_10_3390_app7121304
crossref_primary_10_1007_s10479_017_2486_3
crossref_primary_10_1080_00207721_2013_827261
crossref_primary_10_1142_S0217595912400192
crossref_primary_10_1007_s13198_024_02425_5
Cites_doi 10.1109/24.784276
10.1016/0377-2217(87)90135-4
10.1016/j.ress.2007.11.004
10.1198/000313001317098211
10.1109/12.565602
10.1016/S0951-8320(99)00020-4
10.1109/TSMCA.2006.889475
10.1109/ICSM.2002.1167772
10.1142/S0218539397000199
10.1016/S0026-2714(99)00235-8
10.1016/j.jss.2006.02.030
10.1016/j.infsof.2007.12.001
10.1023/A:1018958810083
10.1109/12.743412
10.2307/3233963
10.1109/TSMCA.2007.893454
10.1016/0143-8174(85)90011-3
10.1109/3468.983418
10.1002/asmb.453
10.1109/TR.1979.5220566
10.1504/IJMOR.2009.024292
10.1109/TC.2004.1261844
10.1109/TR.2006.879611
10.1080/00207729608929237
10.1109/TR.1985.5222222
10.1109/TSMCA.2008.2007982
10.1109/TSMCA.2003.812597
ContentType Journal Article
DBID 97E
RIA
RIE
AAYXX
CITATION
7SC
7SP
7TB
8FD
F28
FR3
JQ2
L7M
L~C
L~D
DOI 10.1109/TSMCC.2010.2042713
DatabaseName IEEE Xplore (IEEE)
IEEE All-Society Periodicals Package (ASPP) 1998–Present
IEEE Electronic Library (IEL)
CrossRef
Computer and Information Systems Abstracts
Electronics & Communications Abstracts
Mechanical & Transportation Engineering Abstracts
Technology Research Database
ANTE: Abstracts in New Technology & Engineering
Engineering Research Database
ProQuest Computer Science Collection
Advanced Technologies Database with Aerospace
Computer and Information Systems Abstracts – Academic
Computer and Information Systems Abstracts Professional
DatabaseTitle CrossRef
Technology Research Database
Computer and Information Systems Abstracts – Academic
Mechanical & Transportation Engineering Abstracts
Electronics & Communications Abstracts
ProQuest Computer Science Collection
Computer and Information Systems Abstracts
Engineering Research Database
Advanced Technologies Database with Aerospace
ANTE: Abstracts in New Technology & Engineering
Computer and Information Systems Abstracts Professional
DatabaseTitleList
Technology Research Database
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library (IEL)
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
Sciences (General)
EISSN 1558-2442
EndPage 437
ExternalDocumentID 10_1109_TSMCC_2010_2042713
5437299
Genre orig-research
GroupedDBID -~X
0R~
29I
4.4
5VS
6IK
97E
AAJGR
AASAJ
AAWTH
ABAZT
ABQJQ
ABVLG
ACGFS
AETIX
AGQYO
AGSQL
AHBIQ
AI.
AIBXA
ALLEH
ALMA_UNASSIGNED_HOLDINGS
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
EBS
EJD
F5P
HZ~
H~9
IFIPE
IFJZH
IPLJI
JAVBF
LAI
M43
O9-
OCL
PZZ
RIA
RIE
RNS
VH1
AAYXX
CITATION
7SC
7SP
7TB
8FD
F28
FR3
JQ2
L7M
L~C
L~D
ID FETCH-LOGICAL-c327t-e533bd8679e8d9bff55db04a44449d8fb46ac59f76091d329ae33693d424ddc93
IEDL.DBID RIE
ISSN 1094-6977
IngestDate Fri Sep 05 12:46:59 EDT 2025
Thu Apr 24 22:51:13 EDT 2025
Wed Oct 01 04:31:23 EDT 2025
Tue Aug 26 17:10:57 EDT 2025
IsPeerReviewed true
IsScholarly true
Issue 4
Language English
License https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c327t-e533bd8679e8d9bff55db04a44449d8fb46ac59f76091d329ae33693d424ddc93
Notes ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
PQID 753678808
PQPubID 23500
PageCount 9
ParticipantIDs proquest_miscellaneous_753678808
crossref_citationtrail_10_1109_TSMCC_2010_2042713
crossref_primary_10_1109_TSMCC_2010_2042713
ieee_primary_5437299
ProviderPackageCode CITATION
AAYXX
PublicationCentury 2000
PublicationDate 2010-July
2010-07-00
20100701
PublicationDateYYYYMMDD 2010-07-01
PublicationDate_xml – month: 07
  year: 2010
  text: 2010-July
PublicationDecade 2010
PublicationTitle IEEE transactions on systems, man and cybernetics. Part C, Applications and reviews
PublicationTitleAbbrev TSMCC
PublicationYear 2010
Publisher IEEE
Publisher_xml – name: IEEE
References ref13
ref12
ref15
ref14
ref30
ref11
ref32
ref2
ref1
ref17
ref16
ref19
ref18
huang (ref26) 2000
ref24
ref23
ref25
ref20
kimura (ref3) 1995
ref22
ref21
pham (ref10) 2000
sgarbossa (ref31) 0
ref28
ref27
ref29
ref8
ref7
ref9
ref4
ref6
ref5
References_xml – ident: ref7
  doi: 10.1109/24.784276
– ident: ref14
  doi: 10.1016/0377-2217(87)90135-4
– ident: ref17
  doi: 10.1016/j.ress.2007.11.004
– ident: ref29
  doi: 10.1198/000313001317098211
– ident: ref2
  doi: 10.1109/12.565602
– ident: ref4
  doi: 10.1016/S0951-8320(99)00020-4
– ident: ref23
  doi: 10.1109/TSMCA.2006.889475
– ident: ref27
  doi: 10.1109/ICSM.2002.1167772
– ident: ref6
  doi: 10.1142/S0218539397000199
– year: 2000
  ident: ref10
  publication-title: Software Reliability
– ident: ref20
  doi: 10.1016/S0026-2714(99)00235-8
– ident: ref18
  doi: 10.1016/j.jss.2006.02.030
– ident: ref19
  doi: 10.1016/j.infsof.2007.12.001
– start-page: 72
  year: 2000
  ident: ref26
  article-title: quantitative software reliability modeling from testing to operation
  publication-title: Proc IEEE Int Symp Softw Rel Eng
– ident: ref8
  doi: 10.1023/A:1018958810083
– ident: ref9
  doi: 10.1109/12.743412
– ident: ref30
  doi: 10.2307/3233963
– ident: ref24
  doi: 10.1109/TSMCA.2007.893454
– ident: ref21
  doi: 10.1016/0143-8174(85)90011-3
– year: 0
  ident: ref31
  article-title: age replacement policy in random environment using systemability
  publication-title: Int J Syst Sci
– ident: ref11
  doi: 10.1109/3468.983418
– ident: ref12
  doi: 10.1002/asmb.453
– ident: ref1
  doi: 10.1109/TR.1979.5220566
– ident: ref32
  doi: 10.1504/IJMOR.2009.024292
– ident: ref15
  doi: 10.1109/TC.2004.1261844
– ident: ref16
  doi: 10.1109/TR.2006.879611
– ident: ref25
  doi: 10.1109/3468.983418
– ident: ref5
  doi: 10.1080/00207729608929237
– start-page: 215
  year: 1995
  ident: ref3
  article-title: optimal software release policies with random life-cycle and delivery delay
  publication-title: Proc ISSAT Int Conf Rel Qual Des
– ident: ref13
  doi: 10.1109/TR.1985.5222222
– ident: ref28
  doi: 10.1109/TSMCA.2008.2007982
– ident: ref22
  doi: 10.1109/TSMCA.2003.812597
SSID ssj0014493
Score 2.062831
Snippet We present a generalized cost model subject to random field environments with considerations of cost to remove failures during testing and warranty periods,...
SourceID proquest
crossref
ieee
SourceType Aggregation Database
Enrichment Source
Index Database
Publisher
StartPage 429
SubjectTerms Application software
Cost engineering
Costs
Cybernetics
Environmental factors
Field random environments
Manufacturing industries
nonhomogeneous Poisson process (NHPP)
optimal release time
Optimization
Policies
Prototypes
reliability growth
Shape
Software reliability
System failures
System reliability
System testing
Systems engineering and theory
testing environments
Warranties
Title A Cost Analysis of Systems Subject to Random Field Environments and Reliability
URI https://ieeexplore.ieee.org/document/5437299
https://www.proquest.com/docview/753678808
Volume 40
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
journalDatabaseRights – providerCode: PRVIEE
  databaseName: IEEE Electronic Library (IEL)
  customDbUrl:
  eissn: 1558-2442
  dateEnd: 20121231
  omitProxy: false
  ssIdentifier: ssj0014493
  issn: 1094-6977
  databaseCode: RIE
  dateStart: 19980101
  isFulltext: true
  titleUrlDefault: https://ieeexplore.ieee.org/
  providerName: IEEE
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3NS8MwFH_MnfTgx6Y4v8jBg6KdbZM2yXEMxxCmoBt4K03zelFbcd1B_3qTfoz5gdhToAkEfkneS97v_R7AqUgpd33pOUIKdJiIqSNCpcwtBVMPVWgFRyzb4jYcz9jNY_DYgstlLgwiluQz7NtmGcvXebKwT2VXQRlkkmuwxrmscrWWEQPGZEWml8wJjVPTJMi48mr6MBkOKxaXb0tLePSLESqrqvw4ikv7MtqCSTOzilby1F8Uqp98fBNt_O_Ut2GzdjTJoFoZO9DCrAMbK_KDHdipN_acnNXq0-dduBuQYT4vSKNWQvKU1LLmxJwy9tmGFDm5jzOdv5CRJcCR65VsOWJ-EEt0rgTA33dhNrqeDsdOXXXBSajPCweNA6i01eFDoaVK0yDQymUxM5_UIlUsjJNAptzg6GnqyxgpDSXVzGdaJ5LuQTvLM9wHIhPhckQWo9JMCR1z4x4kLjc-JVcyTHvgNTBESS1JbitjPEfl1cSVUQldZKGLauh6cLEc81oJcvzZu2uxWPasYegBadCOzHayMZI4w3wxj8ztzZhv4YqD30cewnrFH7CE3SNoF28LPDZuSaFOyvX4Ccre3Os
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3JTsMwEB2xHIADSwFRVh84gCBtEjuJfayqVmUpSNBK3KI4nlyABNH0AF-PnaViEyInS7ElS8_LjOfNG4BjntDAdoVjccHRYjyiFvel1F4KJg5K3wiOGLbFjT8Ys8sH72EOzme5MIhYkM-wZZpFLF9l8dQ8lbW9Isgk5mHR015FUGZrzWIGjImSTi-Y5Wuzpk6RsUV7dD_sdksel2uKSzj0yzVU1FX5cRgXN0x_DYb13EpiyWNrmstW_P5NtvG_k1-H1crUJJ1ybWzAHKYNWPkkQNiAjWprT8hJpT99ugm3HdLNJjmp9UpIlpBK2Jzoc8Y83JA8I3dRqrJn0jcUONL7lC9H9A9iqM6lBPjbFoz7vVF3YFV1F6yYukFuoTYBpTJKfMiVkEnieUraLGL6E4onkvlR7Ikk0Eg6iroiQkp9QRVzmVKxoNuwkGYp7gARMbcDRBahVExyFQXaQIjtQFuVgRR-0gSnhiGMK1FyUxvjKSycE1uEBXShgS6soGvC2WzMSynJ8WfvTYPFrGcFQxNIjXaoN5SJkkQpZtNJqP03fYFzm-_-PvIIlgaj4XV4fXFztQfLJZvA0Hf3YSF_neKBNlJyeViszQ-PuuA8
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=A+Cost+Analysis+of+Systems+Subject+to+Random+Field+Environments+and+Reliability&rft.jtitle=IEEE+transactions+on+systems%2C+man+and+cybernetics.+Part+C%2C+Applications+and+reviews&rft.au=Sgarbossa%2C+Fabio&rft.au=Pham%2C+Hoang&rft.date=2010-07-01&rft.issn=1094-6977&rft.eissn=1558-2442&rft.volume=40&rft.issue=4&rft.spage=429&rft.epage=437&rft_id=info:doi/10.1109%2FTSMCC.2010.2042713&rft.externalDBID=NO_FULL_TEXT
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1094-6977&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1094-6977&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1094-6977&client=summon