Experimental Observation and Modeling of the Impact of Traps on Static and Analog/HF Performance of Graphene Transistors - Pacheco-Sanchez, Anibal; Mavredakis, Nikolaos; Feijoo, Pedro C.; Wei, Wei; Pallecchi, Emiliano; Happy, Henri; Jimenez, David (IEEE transactions on electron devices, 2020)
Keywords: Analytical model; channel potential; Electronics; Engineering Sciences; Field effect transistors; Graphene; graphene field-effect transistor (GFET); high-frequency (HF) performance; Hysteresis; Logic gates; opposing pulses; Performance evaluation; Pulse measurements; Semiconductor devices; Transistors; traps; Voltage measurement; Voltage pulses; Performance evaluation; opposing pulses; Voltage measurement; Pulse measurements; Analytical model; traps; channel potential; Graphene; Logic gates; graphene field-effect transistor (GFET); Transistors; Hysteresis; high-frequency (HF) performance