Predictive Maintenance System for Wafer Transport Robot Using K-Means Algorithm and Neural Network Model - Yoo, Ji-Hyun; Park, Young-Kook; Han, Seung-Soo (Electronics (Basel), 2022)
Keywords: Algorithms; Artificial neural networks; Cameras; Cluster analysis; Clustering; Datasets; Economic impact; Equipment costs; Experiments; Failure; Feature extraction; Maintenance costs; Neural networks; Predictive maintenance; Robots; Sensors