X-Press: Two-Stage X-Tolerant Compactor With Programmable Selector

This paper presents X-Press - a new two-stage test-response compactor that can be easily integrated with a multiple scan-chain environment. This compactor preserves all benefits of spatial compaction and offers, due to its overdrive sequential section, compression much higher than the ratio of scan...

Full description

Saved in:
Bibliographic Details
Published inIEEE transactions on computer-aided design of integrated circuits and systems Vol. 27; no. 1; pp. 147 - 159
Main Authors Rajski, J., Tyszer, J., Mrugalski, G., Wu-Tung Cheng, Mukherjee, N., Kassab, M.
Format Journal Article
LanguageEnglish
Published New York IEEE 01.01.2008
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects
Algorithm design and analysis
Associate members
Automatic test pattern generation
Compaction
Compressing
Counting
Design engineering
Diagnostic systems
Error analysis
Fault diagnosis
Feasibility
Logic testing
Maintenance
Observability
Preserves
Registers
scan-based designs
scan-chain selection
Selectors
Silicon
Studies
test-response compaction
unknown (X) states
scan-based designs
fault diagnosis
scan chain selection
test response compaction
unknown states
Online AccessGet full text
ISSN0278-0070
1937-4151
DOI10.1109/TCAD.2007.907276

Cover

More Information
Summary:This paper presents X-Press - a new two-stage test-response compactor that can be easily integrated with a multiple scan-chain environment. This compactor preserves all benefits of spatial compaction and offers, due to its overdrive sequential section, compression much higher than the ratio of scan chains to compactor outputs. X-Press is also capable of handling a wide range of unknown (X) state profiles by deploying a two-level scan-chain-selection mechanism. In addition to a new compactor architecture, original contributions of this paper include a detailed analysis of two-level error masking caused by X states and a new algorithm to both rank scan chains and then to determine, in per-pattern mode, scan-chain-selection rules used to suppress X states. Experimental results obtained for a variety of designs show feasibility and efficiency of the proposed compaction scheme, altogether with actual impact of X states on a test-pattern count. Finally, diagnostic capabilities of the proposed scheme accompanied by further experimental results are also analyzed.
Bibliography:ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 14
ObjectType-Article-2
ObjectType-Feature-1
content type line 23
ISSN:0278-0070
1937-4151
DOI:10.1109/TCAD.2007.907276