Space Imaging Sensor Power Supply Filtering: Improving EMC Margin Assessment with Clustering and Sensitivity Analyses
This work is dedicated to the assessment of the filtering performances of an optoelectronic sensor for space applications. Particular care is taken concerning the power supply subsystem (here voltage shifter integrated circuit), which is part of the electromagnetic compatibility (EMC) compliance of...
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          | Published in | Electronics (Basel) Vol. 10; no. 18; p. 2301 | 
|---|---|
| Main Authors | , | 
| Format | Journal Article | 
| Language | English | 
| Published | 
        Basel
          MDPI AG
    
        01.09.2021
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| Subjects | |
| Online Access | Get full text | 
| ISSN | 2079-9292 2079-9292  | 
| DOI | 10.3390/electronics10182301 | 
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| Abstract | This work is dedicated to the assessment of the filtering performances of an optoelectronic sensor for space applications. Particular care is taken concerning the power supply subsystem (here voltage shifter integrated circuit), which is part of the electromagnetic compatibility (EMC) compliance of an imaging equipment embedded on spacecrafts. The proposed methodology aims at two major targets: First, evaluating the Filter Effectiveness (FE) subject concerning varying parameters (including filter topology, parasitic effects and source/load impedance variations); second, quantifying the relative importance of representative equivalent electrical components through sensitivity analyses (nominal and parasitic values). The latter point is of utmost importance considering the expected versatility of such systems, such as manufacturing tolerances, for instance. Nominal values and/or components are often badly defined for confidentiality reasons, lack of knowledge or pure ignorance of inputs. An analytical deterministic formulation (here through the transfer matrix approach) is proposed and completed with an original stochastic strategy (Reduced Order Clustering, ROC). This ensures the reliable assessment of both statistical filter performances and most influential parameters, jointly with computational resources saving relatively to brute force Monte Carlo simulations. | 
    
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| AbstractList | This work is dedicated to the assessment of the filtering performances of an optoelectronic sensor for space applications. Particular care is taken concerning the power supply subsystem (here voltage shifter integrated circuit), which is part of the electromagnetic compatibility (EMC) compliance of an imaging equipment embedded on spacecrafts. The proposed methodology aims at two major targets: First, evaluating the Filter Effectiveness (FE) subject concerning varying parameters (including filter topology, parasitic effects and source/load impedance variations); second, quantifying the relative importance of representative equivalent electrical components through sensitivity analyses (nominal and parasitic values). The latter point is of utmost importance considering the expected versatility of such systems, such as manufacturing tolerances, for instance. Nominal values and/or components are often badly defined for confidentiality reasons, lack of knowledge or pure ignorance of inputs. An analytical deterministic formulation (here through the transfer matrix approach) is proposed and completed with an original stochastic strategy (Reduced Order Clustering, ROC). This ensures the reliable assessment of both statistical filter performances and most influential parameters, jointly with computational resources saving relatively to brute force Monte Carlo simulations. | 
    
| Author | Lalléchère, Sébastien Patier, Laurent  | 
    
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| Cites_doi | 10.1109/TEMC.2019.2904973 10.2528/PIERL19080904 10.3390/electronics9050877 10.1109/APEMC.2016.7522865 10.3390/electronics10060721 10.1109/TEMC.1976.303453 10.1109/EMCEurope.2019.8871623 10.3390/en12071405 10.1109/ISEMC.2013.6670376 10.1016/j.cageo.2012.03.008  | 
    
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| Copyright | 2021 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License. | 
    
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| SubjectTerms | Clustering Electric components Electric power supplies Electromagnetic compatibility Filtration Integrated circuits Mathematical analysis Mercury cadmium telluride Optoelectronic devices Parameters Power supply Sensitivity analysis Sensors Space applications Subsystems Tolerances Topology Transfer matrices Transistors  | 
    
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| Title | Space Imaging Sensor Power Supply Filtering: Improving EMC Margin Assessment with Clustering and Sensitivity Analyses | 
    
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