Space Imaging Sensor Power Supply Filtering: Improving EMC Margin Assessment with Clustering and Sensitivity Analyses

This work is dedicated to the assessment of the filtering performances of an optoelectronic sensor for space applications. Particular care is taken concerning the power supply subsystem (here voltage shifter integrated circuit), which is part of the electromagnetic compatibility (EMC) compliance of...

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Published inElectronics (Basel) Vol. 10; no. 18; p. 2301
Main Authors Patier, Laurent, Lalléchère, Sébastien
Format Journal Article
LanguageEnglish
Published Basel MDPI AG 01.09.2021
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ISSN2079-9292
2079-9292
DOI10.3390/electronics10182301

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Abstract This work is dedicated to the assessment of the filtering performances of an optoelectronic sensor for space applications. Particular care is taken concerning the power supply subsystem (here voltage shifter integrated circuit), which is part of the electromagnetic compatibility (EMC) compliance of an imaging equipment embedded on spacecrafts. The proposed methodology aims at two major targets: First, evaluating the Filter Effectiveness (FE) subject concerning varying parameters (including filter topology, parasitic effects and source/load impedance variations); second, quantifying the relative importance of representative equivalent electrical components through sensitivity analyses (nominal and parasitic values). The latter point is of utmost importance considering the expected versatility of such systems, such as manufacturing tolerances, for instance. Nominal values and/or components are often badly defined for confidentiality reasons, lack of knowledge or pure ignorance of inputs. An analytical deterministic formulation (here through the transfer matrix approach) is proposed and completed with an original stochastic strategy (Reduced Order Clustering, ROC). This ensures the reliable assessment of both statistical filter performances and most influential parameters, jointly with computational resources saving relatively to brute force Monte Carlo simulations.
AbstractList This work is dedicated to the assessment of the filtering performances of an optoelectronic sensor for space applications. Particular care is taken concerning the power supply subsystem (here voltage shifter integrated circuit), which is part of the electromagnetic compatibility (EMC) compliance of an imaging equipment embedded on spacecrafts. The proposed methodology aims at two major targets: First, evaluating the Filter Effectiveness (FE) subject concerning varying parameters (including filter topology, parasitic effects and source/load impedance variations); second, quantifying the relative importance of representative equivalent electrical components through sensitivity analyses (nominal and parasitic values). The latter point is of utmost importance considering the expected versatility of such systems, such as manufacturing tolerances, for instance. Nominal values and/or components are often badly defined for confidentiality reasons, lack of knowledge or pure ignorance of inputs. An analytical deterministic formulation (here through the transfer matrix approach) is proposed and completed with an original stochastic strategy (Reduced Order Clustering, ROC). This ensures the reliable assessment of both statistical filter performances and most influential parameters, jointly with computational resources saving relatively to brute force Monte Carlo simulations.
Author Lalléchère, Sébastien
Patier, Laurent
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Cites_doi 10.1109/TEMC.2019.2904973
10.2528/PIERL19080904
10.3390/electronics9050877
10.1109/APEMC.2016.7522865
10.3390/electronics10060721
10.1109/TEMC.1976.303453
10.1109/EMCEurope.2019.8871623
10.3390/en12071405
10.1109/ISEMC.2013.6670376
10.1016/j.cageo.2012.03.008
ContentType Journal Article
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StartPage 2301
SubjectTerms Clustering
Electric components
Electric power supplies
Electromagnetic compatibility
Filtration
Integrated circuits
Mathematical analysis
Mercury cadmium telluride
Optoelectronic devices
Parameters
Power supply
Sensitivity analysis
Sensors
Space applications
Subsystems
Tolerances
Topology
Transfer matrices
Transistors
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