APA (7th ed.) Citation

Liou, J., Krstic, A., Jiang, Y., & Cheng, K. (2003). Modeling, testing, and analysis for delay defects and noise effects in deep submicron devices. IEEE transactions on computer-aided design of integrated circuits and systems, 22(6), 756-769. https://doi.org/10.1109/TCAD.2003.811442

Chicago Style (17th ed.) Citation

Liou, Jing-Jia, A. Krstic, Yi-Ming Jiang, and Kwang-Ting Cheng. "Modeling, Testing, and Analysis for Delay Defects and Noise Effects in Deep Submicron Devices." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems 22, no. 6 (2003): 756-769. https://doi.org/10.1109/TCAD.2003.811442.

MLA (9th ed.) Citation

Liou, Jing-Jia, et al. "Modeling, Testing, and Analysis for Delay Defects and Noise Effects in Deep Submicron Devices." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems, vol. 22, no. 6, 2003, pp. 756-769, https://doi.org/10.1109/TCAD.2003.811442.