Real-time defect detection of TFT-LCD displays using a lightweight network architecture - Chen, Ping; Chen, Mingfang; Wang, Sen; Song, Yanjin; Cui, Yu; Chen, Zhongping; Zhang, Yongxia; Chen, Songlin; Mo, Xiang (Journal of intelligent manufacturing, 2024)
Keywords: Accuracy; Advanced manufacturing technologies; Algorithms; Business and Management; Clustering; Control; Convolution; Crystal defects; Feature maps; LCDs; Liquid crystal displays; Machines; Manufacturing; Mechatronics; Object recognition; Processes; Production; Real time; Robotics; Semiconductor devices; Spatial data; Thin film transistors; Thin films; K-means-ciou; ASPP; TFT-LCD defect detection