Hillman, A. R., Skopek, M. A., & Gurman, S. J. (2011). X-Ray spectroscopy of electrochemically deposited iridium oxide films: Detection of multiple sites through structural disorder. Physical chemistry chemical physics : PCCP, 13(12), 5252-5263. https://doi.org/10.1039/C0CP01472A
Chicago Style (17th ed.) CitationHillman, A. Robert, Magdalena A. Skopek, and Stephen J. Gurman. "X-Ray Spectroscopy of Electrochemically Deposited Iridium Oxide Films: Detection of Multiple Sites Through Structural Disorder." Physical Chemistry Chemical Physics : PCCP 13, no. 12 (2011): 5252-5263. https://doi.org/10.1039/C0CP01472A.
MLA (9th ed.) CitationHillman, A. Robert, et al. "X-Ray Spectroscopy of Electrochemically Deposited Iridium Oxide Films: Detection of Multiple Sites Through Structural Disorder." Physical Chemistry Chemical Physics : PCCP, vol. 13, no. 12, 2011, pp. 5252-5263, https://doi.org/10.1039/C0CP01472A.