A review of thickness-induced evolutions of microstructure and superconducting performance of REBa2Cu3O7−δ coated conductor - Lin, Jian-Xin; Liu, Xu-Ming; Cui, Chuan-Wei; Bai, Chuan-Yi; Lu, Yu-Ming; Fan, Feng; Guo, Yan-Qun; Liu, Zhi-Yong; Cai, Chuan-Bing (Advances in manufacturing, 2017)
Keywords: Control; Engineering; Machines; Manufacturing; Mechatronics; Nanotechnology and Microengineering; Processes; Robotics; Critical current density; Thickness effect; Epitaxial texture; Superconducting film; Microstructure; Pinning force