Application of a novel local and automatic PCA algorithm for diffraction pattern denoising in TEM-ASTAR analysis in microelectronics - Printemps, Tony; Dabertrand, Karen; Vives, Jérémy; Valery, Alexia (Ultramicroscopy, 2024)
Keywords: ACOM-TEM; ASTAR; Denoising; Diffraction pattern; Marchenko-Pastur; PCA; ACOM-TEM; Marchenko-Pastur; ASTAR; Diffraction pattern; Denoising; PCA