APA (7th ed.) Citation

Printemps, T., Dabertrand, K., Vives, J., & Valery, A. (2024). Application of a novel local and automatic PCA algorithm for diffraction pattern denoising in TEM-ASTAR analysis in microelectronics. Ultramicroscopy, 267, 114059. https://doi.org/10.1016/j.ultramic.2024.114059

Chicago Style (17th ed.) Citation

Printemps, Tony, Karen Dabertrand, Jérémy Vives, and Alexia Valery. "Application of a Novel Local and Automatic PCA Algorithm for Diffraction Pattern Denoising in TEM-ASTAR Analysis in Microelectronics." Ultramicroscopy 267 (2024): 114059. https://doi.org/10.1016/j.ultramic.2024.114059.

MLA (9th ed.) Citation

Printemps, Tony, et al. "Application of a Novel Local and Automatic PCA Algorithm for Diffraction Pattern Denoising in TEM-ASTAR Analysis in Microelectronics." Ultramicroscopy, vol. 267, 2024, p. 114059, https://doi.org/10.1016/j.ultramic.2024.114059.