Electrical properties and microstructural characterization of Ni/Ta contacts to n-type 6H–SiC - 周天宇 刘学超 黄维 卓世异 郑燕青 施尔畏 (Chinese physics B, 2015)
Keywords: Annealing; Contact; Contact resistance; Microstructure; Nickel; Ohmic; SiC; TAC; Tantalum; Transmission electron microscopy; X射线衍射分析; 微观结构; 电性能; 透射电子显微镜; 镍