施尔畏, 周. 刘. 黄. 卓. 郑. (2015). Electrical properties and microstructural characterization of Ni/Ta contacts to n-type 6H–SiC. Chinese physics B, 24(12), 465-469. https://doi.org/10.1088/1674-1056/24/12/126801
Chicago Style (17th ed.) Citation施尔畏, 周天宇 刘学超 黄维 卓世异 郑燕青. "Electrical Properties and Microstructural Characterization of Ni/Ta Contacts to N-type 6H–SiC." Chinese Physics B 24, no. 12 (2015): 465-469. https://doi.org/10.1088/1674-1056/24/12/126801.
MLA (9th ed.) Citation施尔畏, 周天宇 刘学超 黄维 卓世异 郑燕青. "Electrical Properties and Microstructural Characterization of Ni/Ta Contacts to N-type 6H–SiC." Chinese Physics B, vol. 24, no. 12, 2015, pp. 465-469, https://doi.org/10.1088/1674-1056/24/12/126801.
Warning: These citations may not always be 100% accurate.