APA (7th ed.) Citation

Kumari, N., Krupanidhi, S., & Varma, K. (2008). Structural, ferroelectric and optical properties of Bi2VO5.5 thin films deposited on platinized silicon {(100) Pt/TiO2/SiO2/Si} substrates. Applied physics. A, Materials science & processing, 91(4), 693-699. https://doi.org/10.1007/s00339-008-4509-z

Chicago Style (17th ed.) Citation

Kumari, N., S.B Krupanidhi, and K.B.R Varma. "Structural, Ferroelectric and Optical Properties of Bi2VO5.5 Thin Films Deposited on Platinized Silicon {(100) Pt/TiO2/SiO2/Si} Substrates." Applied Physics. A, Materials Science & Processing 91, no. 4 (2008): 693-699. https://doi.org/10.1007/s00339-008-4509-z.

MLA (9th ed.) Citation

Kumari, N., et al. "Structural, Ferroelectric and Optical Properties of Bi2VO5.5 Thin Films Deposited on Platinized Silicon {(100) Pt/TiO2/SiO2/Si} Substrates." Applied Physics. A, Materials Science & Processing, vol. 91, no. 4, 2008, pp. 693-699, https://doi.org/10.1007/s00339-008-4509-z.