Micro-track structure analysis for 100 MeV Si ions in CR-39 by using atomic force microscopy - 方美华 魏志勇 张紫霞 朱立 府宇 石苗 黎光武 郭刚 (Chinese physics B, 2013)
Keywords: Atomic force microscopy; Atomic structure; Chromium; CR-39; Etch pits; Etching; Mathematical models; MeV; Silicon; Tracking; 刻蚀速率; 原子力显微镜; 硅离子; 结构分析; 蚀刻速率; 轨道结构