郭刚, 方. 魏. 张. 朱. 府. 石. 黎. (2013). Micro-track structure analysis for 100 MeV Si ions in CR-39 by using atomic force microscopy. Chinese physics B, 22(11), 436-439. https://doi.org/10.1088/1674-1056/22/11/116105
Chicago Style (17th ed.) Citation郭刚, 方美华 魏志勇 张紫霞 朱立 府宇 石苗 黎光武. "Micro-track Structure Analysis for 100 MeV Si Ions in CR-39 by Using Atomic Force Microscopy." Chinese Physics B 22, no. 11 (2013): 436-439. https://doi.org/10.1088/1674-1056/22/11/116105.
MLA (9th ed.) Citation郭刚, 方美华 魏志勇 张紫霞 朱立 府宇 石苗 黎光武. "Micro-track Structure Analysis for 100 MeV Si Ions in CR-39 by Using Atomic Force Microscopy." Chinese Physics B, vol. 22, no. 11, 2013, pp. 436-439, https://doi.org/10.1088/1674-1056/22/11/116105.
Warning: These citations may not always be 100% accurate.